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2SC1959

Toshiba Semiconductor

PNP Transistor - Toshiba Semiconductor


2SC1959
2SC1959

PDF File 2SC1959 PDF File



Description
TOSHIBA Transistor Silicon PNP Epitaxial Type (PCT process) 2SC1959 Audio Frequency Low Power Amplifier Applications Driver Stage Amplifier Applications Switching Applications 2SC1959 Unit: mm · Excellent hFE linearity: hFE (2) = 25 (min): VCE = 6 V, IC = 400 mA · 1 watt amplifier applications.
· Complementary to 2SA562TM.
Maximum Ratings (Ta = 25°C) Characteristics Collector-base voltage Collector-emitter voltage Emitter-base voltage Collector current Base current Collector power dissipation Junction temperature Storage temperature range Symbol VCBO VCEO VEBO IC IB PC Tj Tstg Rating 35 30 5 500 100 500 150 -55~150 Unit V V V mA mA mW °C °C Electrical Characteristics (Ta = 25°C) Characteristics Symbol Test Condition Collector cut-off current Emitter cut-off current DC current gain Collector-emitter saturation voltage Base-emitter voltage Transition frequency Collector output capacitance ICBO IEBO VCB = 35 V, IE = 0 VEB = 5 V, IC = 0 hFE (1) VCE = 1 V, IC = 100 mA (Note) hFE (2) VCE = 6 V, IC = 400 mA (Note) VCE (sat) VBE fT Cob IC = 100 mA, IB = 10 mA VCE = 1 V, IC = 100 mA VCE = 6 V, IC = 20 mA VCB = 6 V, IE = 0, f = 1 MHz Note: hFE (1) classification O: 70~140, Y: 120~240, GR: 200~400 hFE (2) classification O: 25 (min), Y: 40 (min) JEDEC TO-92 JEITA SC-43 TOSHIBA 2-5F1B Weight: 0.
21 g (typ.
) Min Typ.
Max Unit ¾ ¾ 0.
1 mA ¾ ¾ 0.
1 mA 70 ¾ 400 25 ¾ ¾ ¾ 0.
1 0.
25 V ¾ 0.
8 1.
0 V ¾ 300 ¾ MHz ¾ 7 ¾ pF 1 2003-03-24 2SC1959 2 2003-03-24 2SC1959 RESTRICTIONS ON PRODUCT USE 000707EAA · TOSHIBA is continually working to improve the quality and reliability of its products.
Nevertheless, semiconductor devices in general can malfunction or fail due to their inherent electrical sensitivity and vulnerability to physical stress.
It is the responsibility of the buyer, when utilizing TOSHIBA products, to comply with the standards of safety in making a safe design for the entire system, and to avoid situations in which a malfunction or failure of such TOS...



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