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CTS05S40

Toshiba

Schottky Barrier Diode - Toshiba


CTS05S40
CTS05S40

PDF File CTS05S40 PDF File



Description
Schottky Barrier Diode Silicon Epitaxial CTS05S40 1.
Applications • High-Speed Switching 2.
Packaging and Internal Circuit CTS05S40 1: Cathode 2: Anode CST2 3.
Absolute Maximum Ratings (Note) (Unless otherwise specified, Ta = 25 ) Characteristics Symbol Note Rating Unit Peak reverse voltage VRM 40 V Reverse voltage VR 30 Average rectified current IO (Note 1) 0.
5 A Non-repetitive peak forward surge current IFSM (Note 2) 2 Junction temperature Tj 125  Storage temperature Tstg -55 to 125 Note: Using continuously under heavy loads (e.
g.
the application of high temperature/current/voltage and the significant change in temperature, etc.
) may cause this product to decrease in the reliability significantly even if the operating conditions (i.
e.
operating temperature/current/voltage, etc.
) are within the absolute maximum ratings.
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook ("Handling Precautions"/"Derating Concept and Methods") and individual reliability data (i.
e.
reliability test report and estimated failure rate, etc).
Note 1: Mounted on an FR4 board.
(25.
4 mm × 25.
4 mm × 1.
6 mm, Cu Pad: 645 mm2) Note 2: Measured with a 10 ms pulse.
Start of commercial production 2013-06 1 2014-04-04 Rev.
3.
0 CTS05S40 4.
Electrical Characteristics (Unless otherwise specified, Ta = 25 ) Characteristics Forward voltage Forward voltage Reverse current Reverse current Total capacitance Symbol Test Condition VF(1) VF(2) IR(1) IR(2) Ct IF = 0.
1 A (Pulse test) IF = 0.
5 A (Pulse test) VR = 10 V (Pulse test) VR = 40 V (Pulse test) VR = 0 V, f = 1 MHz Min Typ.
Max Unit  0.
31 0.
35 V  0.
56 0.
60 V   30 µA   50 µA  42  pF 5.
Marking Marking Code 7A Fig.
5.
1 Marking Part Number CTS05S40 6.
Usage Considerations • Schottky barrier diodes (SBDs) have reverse leakage greater than other types of diodes.
This makes SBDs more susceptible to thermal runaway under high-temperature and high-voltage conditio...



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