GT50J325
TOSHIBA Insulated Gate Bipolar Transistor Silicon N Channel IGBT
GT50J325
High Power Switching Applications Fa...
GT50J325
TOSHIBA Insulated Gate Bipolar
Transistor Silicon N Channel IGBT
GT50J325
High Power Switching Applications Fast Switching Applications
Unit: mm
Fourth generation IGBT Enhancement mode type Fast switching (FS): Operating frequency up to 50 kHz (reference)
High speed: tf = 0.05 μs (typ.) Low switching loss: Eon = 1.30 mJ (typ.)
: Eoff = 1.34 mJ (typ.) Low saturation Voltage: VCE (sat) = 2.0 V (typ.) FRD included between emitter and collector
Absolute Maximum Ratings (Ta = 25°C)
Characteristics
Collector-emitter voltage
Gate-emitter voltage
Collector current
DC 1 ms
Emitter-collector forward current
DC 1 ms
Collector power dissipation (Tc = 25°C)
Junction temperature
Storage temperature range
Symbol
Rating
Unit
VCES
600
V
VGES
±20
V
IC
50 A
ICP
100
IF
50 A
IFM
100
PC
240
W
Tj
150
°C
Tstg
−55 to 150
°C
JEDEC JEITA TOSHIBA Weight: 9.75 g
― ― 2-21F2C
Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum ratings. Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook (“Handling Precautions”/Derating Concept and Methods) and individual reliability data (i.e. reliability test report and estimated...