GT50J322
TOSHIBA INSULATED GATE BIPOLAR TRANSISTOR SILICON N CHANNEL IGBT
GT50J322
FOURTH GENERATION IGBT CURRENT RESON...
GT50J322
TOSHIBA INSULATED GATE BIPOLAR
TRANSISTOR SILICON N CHANNEL IGBT
GT50J322
FOURTH GENERATION IGBT CURRENT RESONANCE INVERTER SWITCHING APPLICATIONS
Unit: mm
z FRD included between emitter and collector
z Enhancement mode type
z High speed
: tf = 0.25μs (Typ.) (IC = 50A)
z Low saturation voltage : VCE (sat) = 2.1V (Typ.) (IC = 50A)
ABSOLUTE MAXIMUM RATINGS (Ta = 25°C)
CHARACTERISTIC
SYMBOL
RATING
UNIT
Collector−Emitter Voltage
Gate−Emitter Voltage
Collector Current
DC 1ms
Emitter-Collector Foward Current
DC 1ms
Collector Power Dissipation (Tc = 25°C)
Junction Temperature
Storage Temperature Range
VCES VGES
IC ICP IF IFP
PC
Tj Tstg
600 ±20 50 100 30 60
130
150 −55~150
V V A
A
W °C °C
JEDEC
⎯
JEITA
⎯
TOSHIBA
2-21F2C
Weight: 9.75 g (typ.)
Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum ratings. Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook (“Handling Precautions”/Derating Concept and Methods) and individual reliability data (i.e. reliability test report and estimated failure rate, etc).
EQUIVALENT CIRCUIT
MARKING
TOSHIBA
GT50J322
JAPAN
Part No. (or abbreviation code)
Lot No.
A line indicates lead (P...