(MBM29DL16xTD/BD) FLASH MEMORY CMOS 16M (2M X 8/1M X 16) BIT
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FUJITSU SEMICONDUCTOR DATA SHEET
DS05-20874-7E
FLASH MEMORY
CMOS
16M (2M × 8/1M × 16) BIT
MBM29D...
Description
www.DataSheet4U.com
FUJITSU SEMICONDUCTOR DATA SHEET
DS05-20874-7E
FLASH MEMORY
CMOS
16M (2M × 8/1M × 16) BIT
MBM29DL16XTD/BD -70/90
s FEATURES
Dual Operation
0.33 µm Process Technology Simultaneous Read/Write operations (dual bank) Multiple devices available with different bank sizes (Refer to “MBM29DL16XTD/BD Device Bank Divisions Table” in sGENERAL DESCRIPTION) Host system can program or erase in one bank, then immediately and simultaneously read from the other bank Zero latency between read and write operations Read-while-erase Read-while-program Single 3.0 V read, program, and erase Minimizes system level power requirements (Continued)
s PRODUCT LINE UP
Part No. Ordering Part No. VCC = 3.3 V VCC = 3.0 V
+0.3 V –0.3 V +0.6 V –0.3 V
MBM29DL16XTD/MBM29DL16XBD 70 — 70 70 30 — 90 90 90 35
Max Address Access Time (ns) Max CE Access Time (ns) Max OE Access Time (ns)
s PACKAGES
48-pin plastic TSOP (1)
Marking Side
48-pin plastic TSOP (1)
48-ball plastic FBGA
Marking Side
(FPT-48P-M19)
(FPT-48P-M20)
(BGA-48P-M13)
MBM29DL16XTD/BD-70/90
(Continued) Compatible with JEDEC-standard commands Uses same software commands as E2PROMs Compatible with JEDEC-standard world-wide pinouts 48-pin TSOP(1) (Package suffix: PFTN – Normal Bend Type, PFTR – Reversed Bend Type) 48-ball FBGA (Package suffix: PBT) Minimum 100,000 program/erase cycles High performance 70 ns maximum access time Sector erase architecture Eight 4K word and thirty one 32K word sectors in word ...
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