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MN54F32-X

National Semiconductor

QUAD 2-INPUT OR GATE

www.DataSheet4U.com MILITARY DATA SHEET MN54F32-X REV 1A0 QUAD 2-INPUT OR GATE General Description This device contains...


National Semiconductor

MN54F32-X

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Description
www.DataSheet4U.com MILITARY DATA SHEET MN54F32-X REV 1A0 QUAD 2-INPUT OR GATE General Description This device contains four independent gates, each of which performs the logic OR function. Original Creation Date: 03/12/96 Last Update Date: 07/30/96 Last Major Revision Date: 03/12/96 Industry Part Number 54F32 NS Part Numbers 54F32DMQB 54F32FMQB 54F32LMQB Prime Die M032 Processing MIL-STD-883, Method 5004 Subgrp Description 1 2 3 4 5 6 7 8A 8B 9 10 11 Static tests at Static tests at Static tests at Dynamic tests at Dynamic tests at Dynamic tests at Functional tests at Functional tests at Functional tests at Switching tests at Switching tests at Switching tests at Temp ( oC) +25 +125 -55 +25 +125 -55 +25 +125 -55 +25 +125 -55 Quality Conformance Inspection MIL-STD-883, Method 5005 1 MN54F32-X REV 1A0 MILITARY DATA SHEET (Absolute Maximum Ratings) (Note 1) Storage Temperature -65 C to +150 C Ambient Temperature under Bias -55 C to +125 C Junction Temperature under Bias -55 C to +175 C Vcc Pin Potential to Ground Pin -0.5V to +7.0V Input Voltage (Note 2) -0.5V to +7.0V Input Current (Note 2) -30 mA to +5.0mA Voltage Applied to Output in HIGH State (with Vcc=0V) Standard Output TRI-STATE Output Current Applied to Output in LOW State (Max) ESD Last Passing Voltage (Min) 4000V Note 1: Note 2: Absolute Maximum ratings are those values beyond which the device may be damaged or have its useful life impaired. Functional operation under these condtions is not implied. Either...




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