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NDT456P

Fairchild

P-Channel Enhancement Mode Field Effect Transistor

December 1998 NDT456P P-Channel Enhancement Mode Field Effect Transistor General Description Power SOT P-Channel enhanc...


Fairchild

NDT456P

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Description
December 1998 NDT456P P-Channel Enhancement Mode Field Effect Transistor General Description Power SOT P-Channel enhancement mode power field effect transistors are produced using Fairchild's proprietary, high cell density, DMOS technology. This very high density process is especially tailored to minimize on-state resistance and provide superior switching performance. These devices are particularly suited for low voltage applications such as notebook computer power management, battery powered circuits, and DC motor control. Features -7.5 A, -30 V. RDS(ON) = 0.030 Ω @ VGS = -10 V RDS(ON) = 0.045 Ω @ VGS = -4.5 V. High density cell design for extremely low RDS(ON). High power and current handling capability in a widely used surface mount package. ______________________________________________________________________________ D D G D S G S Absolute Maximum Ratings Symbol Parameter TA = 25°C unless otherwise noted NDT456P Units VDSS VGSS ID Drain-Source Voltage Gate-Source Voltage Drain Current - Continuous - Pulsed (Note 1a) -30 ±20 ±7.5 ±20 (Note 1a) (Note 1b) (Note 1c) V V A PD Maximum Power Dissipation 3 1.3 1.1 -65 to 150 W TJ,TSTG Operating and Storage Temperature Range °C THERMAL CHARACTERISTICS RθJA RθJC Thermal Resistance, Junction-to-Ambient Thermal Resistance, Junction-to-Case (Note 1a) (Note 1) 42 12 °C/W °C/W © 1998 Fairchild Semiconductor Corporation NDT456P Rev. F Electrical Characteristics (T Symbol Parameter OFF CHARACTERISTICS A...




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