SCANH16512SM

SCAN16512 Low Voltage Universal 16-bit IEEE 1149.1 Bus Transceiver with TRI-STATE Outputs August 2002 SCAN16512 Low Voltage Universal 16-bit IEEE 1149.1 Bus Transceiver with TRI-STATE Outputs General Description The SCAN16512 is a high speed, low-power universal bus transceiver featuring data inputs organized into two 8-bit bytes with output enable and latch enable control signals. This function is configurable as a D-type Latch or Flip-Flop, and can operate in transparent, latched, or clocked mode. This device is compliant with IEEE 1149.1 Standard Test Access Port and Boundary Scan Architecture with the incorporation of the defined boundary-scan test logic and test access port consisting of Test Data Input (TDI), Test Data Out (TDO), Test Mode Select (TMS), Test Clock (TCK), and Test Reset (TRST). Features IEEE 1149.1 (JTAG) Compliant 2.7V to 3.6V VCC Operation TRI-STATE outputs for bus-oriented applications Dual byte-wide data for bus applications Power down high Impedance inputs and outputs Optional Bus Hold on data inputs eliminates the need for external pullup/pulldown resistors (SCANH16512, SCANH162512 versions) n Optional 25Ω series resistors in outputs to minimize noise and eliminate termination resistors (SCAN162512, SCANH162512 versions) n Supports live insertion/withdrawal n Includes CLAMP and HIGHZ instructions n n n n n n Block Diagram 20026602 © 2002 National Semiconductor Corporation DS200266 www.national.com SCAN16512 Pin Descriptions Pin Name A10-A...