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SCAN18374T

National Semiconductor
Part Number SCAN18374T
Manufacturer National Semiconductor
Description D Flip-Flop with TRI-STATE Outputs
Published Apr 8, 2005
Detailed Description SCAN18374T D Flip-Flop with TRI-STATE Outputs September 1998 SCAN18374T D Flip-Flop with TRI-STATE ® Outputs General D...
Datasheet PDF File SCAN18374T PDF File

SCAN18374T
SCAN18374T

Overview
SCAN18374T D Flip-Flop with TRI-STATE Outputs September 1998 SCAN18374T D Flip-Flop with TRI-STATE ® Outputs General Description The SCAN18374T is a high speed, low-power D-type flip-flop featuring separate D-type inputs organized into dual 9-bit bytes with byte-oriented clock and output enable control signals.
This device is compliant with IEEE 1149.
1 Standard Test Access Port and BOUNDARY-SCAN Architecture with the incorporation of the defined BOUNDARY-SCAN test logic and test access port consisting of Test Data Input (TDI), Test Data Out (TDO), Test Mode Select (TMS), and Test Clock (TCK).
Features n n n n n n n n n n IEEE 1149.
1 (JTAG) Compliant Buffered positive edge-triggered clock ...


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