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K9F1G16D0M

Samsung semiconductor

128M x 8 Bit / 64M x 16 Bit NAND Flash Memory

www.DataSheet4U.com K9F1G08Q0M K9F1G16Q0M K9F1G08D0M K9F1G16D0M K9F1G08U0M K9F1G16U0M Document Title 128M x 8 Bit / 64M ...


Samsung semiconductor

K9F1G16D0M

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www.DataSheet4U.com K9F1G08Q0M K9F1G16Q0M K9F1G08D0M K9F1G16D0M K9F1G08U0M K9F1G16U0M Document Title 128M x 8 Bit / 64M x 16 Bit NAND Flash Memory FLASH MEMORY Revision History Revision No History 0.0 1. Initial issue Draft Date July. 5. 2001 Remark Advance 0.1 1. Iol(R/B) of 1.8V is changed. - min. value : 7mA --> 3mA - Typ. value : 8mA --> 4mA Nov. 5. 2001 2. AC parameter is changed. tRP(min.) : 30ns --> 25ns 3. A recovery time of minimum 1µs is required before internal circuit gets ready for any command sequences as shown in Figure 17. ---> A recovery time of minimum 10µs is required before internal circuit gets ready for any command sequences as shown in Figure 17. Dec. 4. 2001 0.2 1. ALE status fault in ’Random data out in a page’ timing diagram(page 19) is fixed. 0.3 1. tAR1, tAR2 are merged to tAR.(Page11) (Before revision) min. tAR1 = 10ns , min. tAR2 = 50ns (After revision) min. tAR = 10ns 2. min. tCLR is changed from 50ns to 10ns.(Page11) 3. min. tREA is cha...




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