November 1998
FDG6320C Dual N & P Channel Digital FET
General Description
These dual N & P-Channel logic level enhancem...
November 1998
FDG6320C Dual N & P Channel Digital FET
General Description
These dual N & P-Channel logic level enhancement mode field effect
transistors are produced using Fairchild's proprietary, high cell density, DMOS technology. This very high density process is especially tailored to minimize on-state resistance. This device has been designed especially for low voltage applications as a replacement for bipolar digital
transistors and small signal MOSFETS. Since bias resistors are not required, this dual digital FET can replace several different digital
transistors, with different bias resistor values.
Features
N-Ch 0.22 A, 25 V, RDS(ON) = 4.0 Ω @ VGS= 4.5 V, RDS(ON) = 5.0 Ω @ VGS= 2.7 V. P-Ch -0.14 A, -25V, RDS(ON) = 10 Ω @ VGS= -4.5V, RDS(ON) = 13 Ω @ VGS= -2.7V. Very small package outline SC70-6. Very low level gate drive requirements allowing direct operation in 3 V circuits (VGS(th) < 1.5 V). Gate-Source Zener for ESD ruggedness (>6kV Human Body Model).
SC70-6
SOT-23
SuperSOTTM-6
SOT-8
SO-8
SOIC-14
S2 G2 D1
1
6
.20
G1 D2
2
5
SC70-6
pin 1
S1
3
4
Absolute Maximum Ratings
Symbol VDSS VGSS ID Parameter Drain-Source Voltage Gate-Source Voltage Drain Current
TA = 25oC unless other wise noted N-Channel 25 8 0.22 0.65
(Note 1)
P-Channel -25 -8 -0.14 -0.4 0.3 -55 to 150 6
Units V V A
- Continuous - Pulsed
PD TJ,TSTG ESD
Maximum Power Dissipation
W °C kV
Operating and Storage Temperature Ranger Electrostatic Discharge Rating MIL-STD-883D Human Body ...