High Performance Driver/Comparator on a Single Chip
a
High Performance Driver/Comparator on a Single Chip
AD53033
FEATURES 250 MHz Operation Driver/Comparator Included 5...
Description
a
High Performance Driver/Comparator on a Single Chip
AD53033
FEATURES 250 MHz Operation Driver/Comparator Included 52-Lead LQFP Package with Built-in Heat Sink
APPLICATIONS Automatic Test Equipment Semiconductor Test Systems Board Test Systems Instrumentation and Characterization Equipment
PRODUCT DESCRIPTION The AD53033 is a single chip that performs the pin electronics functions of driver and comparator (D-C) in ATE VLSI and memory testers. The driver is a proprietary design that features three active states: Data High Mode, Data Low Mode and Term Mode as well as an Inhibit State. This facilitates the implementation of high speed active termination. The output voltage range is –3 V to +8 V to accommodate a wide variety of test devices. The output leakage is typically less than 250 nA over the entire signal range. The dual comparator, with an input range equal to the driver output range, features built-in latches and ECL-compatible outputs. The outputs are capable of driving 50 Ω signal lines terminated to –2 V. Signal tracking capability is upwards of 5 V/ns. Also included on the chip is an onboard temperature sensor whose purpose is to give an indication of the surface temperature of the D-C. This information can be used to measure θJC and θJA or flag an alarm if proper cooling is lost. Output from the
FUNCTIONAL BLOCK DIAGRAM
VH 47 VTERM 45
DATA 37 DATAB 38
IOD 43 IODB 42 RLD 49 RLDB 50
VL 31 HCOMP
LEH LEHB
QH QHB
QL QLB LEL LELB LCOMP
VCC VCC VCC 51 52
VEE VEE VE...
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