MOTOROLA
SEMICONDUCTOR TECHNICAL DATA
Order this document by MPQ2483/D
Quad Amplifier Transistors
NPN Silicon
14 13 12...
MOTOROLA
SEMICONDUCTOR TECHNICAL DATA
Order this document by MPQ2483/D
Quad Amplifier
Transistors
NPN Silicon
14 13 12 11 10 9 8
NPN
1234567
MPQ2483 MPQ2484*
*Motorola Preferred Device
MAXIMUM RATINGS
Rating
Symbol
Value
Unit
Collector – Emitter Voltage Collector – Base Voltage Emitter – Base Voltage Collector Current — Continuous
VCEO VCBO VEBO
IC
40
60
6.0
50
Each
Transistor
Four
Transistors Equal Power
Vdc Vdc Vdc mAdc
Total Device Dissipation
@ TA = 25°C(1) Derate above 25°C
PD 500
4.0
900 mW 7.2 mW/°C
Total Device Dissipation
@ TC = 25°C Derate above 25°C
PD 0.825
6.7
2.4 Watts 19.2 mW/°C
Operating and Storage Junction Temperature Range
TJ, Tstg
–55 to +150
°C
THERMAL CHARACTERISTICS
Characteristic
Junction to Case
Junction to Ambient
Unit
Thermal Resistance
Each Die Effective, 4 Die
151 250 °C/W 52 134 °C/W
Coupling Factors
Q1–Q4 or Q2–Q3 Q1–Q2 or Q3–Q4
34 2.0
70 % 26 %
ELECTRICAL CHARACTERISTICS (TA = 25°C unless otherwise noted)
Characteristic
Symbol
Min
OFF CHARACTERISTICS
Collector – Emitter Breakdown Voltage(2) (IC = 10 mAdc, IB = 0)
Collector – Base Breakdown Voltage (IC = 10 mAdc, IE = 0)
Emitter – Base Breakdown Voltage (IE = 10 mAdc, IC = 0)
Collector Cutoff Current (VCB = 45 Vdc, IE = 0)
Emitter Cutoff Current (VEB = 3.0 Vdc, IC = 0)
V(BR)CEO V(BR)CBO V(BR)EBO
ICBO IEBO
40 60 6.0 — —
v v1. Second Breakdown occurs at power levels greater than 3 times the power dissipation rating.
2. Pulse Test: Pulse Width 300 ms; ...