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TPCM8001-H

Toshiba Semiconductor

N-Channel MOSFET


TPCM8001-H
TPCM8001-H

PDF File TPCM8001-H PDF File


Description
TPCM8001-H TOSHIBA Field Effect Transistor Silicon N-Channel MOS Type (Ultra-High-Speed U-MOSIII) TPCM8001-H High-Efficiency DC/DC Converter Applications Notebook PC Applications Portable-Equipment Applications 0.
5±0.
1 Unit: mm 0.
8 8 0.
25±0.
05 0.
05 M A 5 4.
65±0.
3 3.
65±0.
2 • Small footprint due to a small and thin package • High-speed switching • Small gate charge: QSW = 6.
0 nC (typ.
) • Low drain-source ON-resistance: RDS (ON) = 7 mΩ (typ.
) • High forward transfer admittance: |Yfs| =36 S (typ.
) • Low leakage current: IDSS = 10 µA (max) (VDS = 30 V) • Enhancement mode: Vth = 1.
1 to 2.
3 V (VDS = 10 V, ID = 1 mA) 0.
75±0.
05 0.
2+-00.
2 0.
166±0.
05 14 3.
5±0.
2 0.
55 A 0.
05 S S1 4 1.
05± 0 .
2 0.
6±0.
1 2.
2±0.
2 Absolute Maximum Ratings (Ta = 25°C) Characteristic Drain-source voltage Drain-gate voltage (RGS = 20 kΩ) Gate-source voltage Drain current DC (Note 1) Pulsed (Note 1) Drain power dissipation (Tc=25°C) Drain power dissipation (t = 10 s) (Note 2a) Drain power dissipation (t = 10 s) (Note 2b) Single-pulse avalanche energy (Note 3) Avalanche current Repetitive avalanche energy (Tc=25°C) (Note 4) Channel temperature Storage temperature range Symbol VDSS VDGR VGSS ID IDP PD PD PD EAS IAR EAR Tch Tstg Rating 30 30 ±20 20 60 30 2.
3 1.
0 104 20 1.
8 150 −55 to 150 Unit V V V A W W W mJ A mJ °C °C 2.
75±0.
2 8 1,2,3:SOURCE 5,6,7,8:DRAIN 0.
8±0.
1 5 4:GATE JEDEC ― JEITA ― TOSHIBA 2-4L1A Weight: 0.
028 g (typ.
) Circuit Configuration 8765 1234 Note: For Notes 1 to 4, refer to the next page.
Using continuously under heavy loads (e.
g.
the application of high temperature/current/voltage and the significant change in temperature, etc.
) may cause this product to decrease in the reliability significantly even if the operating conditions (i.
e.
operating temperature/current/voltage, etc.
) are within the absolute maximum ratings.
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook (“Handling Preca...



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