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H6N03LAG

Infineon Technologies

IPDH6N03LAG


H6N03LAG
H6N03LAG

PDF File H6N03LAG PDF File


Description
www.
DataSheet.
co.
kr OptiMOS®2 Power-Transistor Features • Ideal for high-frequency dc/dc converters • Qualified according to JEDEC1) for target application • N-channel, logic level • Excellent gate charge x R DS(on) product (FOM) • Superior thermal resistance • 175 °C operating temperature • Pb-free lead plating; RoHS compliant IPDH6N03LA G IPFH6N03LA G IPSH6N03LA G IPUH6N03LA G Product Summary V DS R DS(on),max (SMD version) ID 25 V 6 mΩ 50 A Type IPDH6N03LA G IPFH6N03LA G IPSH6N03LA G IPUH6N03LA G Package Marking PG-TO252-3-11 H6N03LA PG-TO252-3-23 H6N03LA PG-TO251-3-11 H6N03LA PG-TO251-3-1 H6N03LA Maximum ratings, at T j=25 °C, unless otherwise specified Parameter Symbol Conditions Continuous drain current I D T C=25 °C2) T C=100 °C Pulsed drain current I D,pulse T C=25 °C3) Avalanche energy, single pulse E AS I D=50 A, R GS=25 Ω Reverse diode dv /dt dv /dt I D=50 A, V DS=20 V, di /dt =200 A/µs, T j,max=175 °C Gate source voltage4) V GS Power dissipation P tot T C=25 °C Operating and storage temperature T j, T stg IEC climatic category; DIN IEC 68-1 Value 50 50 350 150 6 ±20 71 -55 .
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175 55/175/56 Unit A mJ kV/µs V W °C Rev.
1.
3 page 1 2006-05-11 Datasheet pdf - http://www.
DataSheet4U.
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DataSheet.
co.
kr IPDH6N03LA G IPFH6N03LA G IPSH6N03LA G IPUH6N03LA G Parameter Symbol Conditions min.
Values typ.
Unit max.
Thermal characteristics Thermal resistance, junction - case SMD version, device on PCB R thJC R thJA minimal footprint 6 cm2 cooling area5) - - 2.
1 K/W - 75 - 50 Electrical characteristics, at T j=25 °C, unless otherwise specified Static characteristics Drain-source breakdown voltage Gate threshold voltage Zero gate voltage drain current Gate-source leakage current Drain-source on-state resistance Gate resistance Transconductance V (BR)DSS V GS=0 V, I D=1 mA V GS(th) V DS=V GS, I D=30 µA I DSS V DS=25 V, V GS=0 V, T j=25 °C V DS=25 V, V GS=0 V, T j=125 °C I GSS R DS(on) V GS=20 V, V DS=0 V V G...



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