Cell-based ASIC
Description
Features
• Comprehensive Library of Standard Logic Cells • ATC35 I/O Cells Designed to Operate with VDD = 3.
3V ± 0.
3V as Main Target Operating
Conditions IO35 Pad Library Provides Interface to 5V Environment Oscillators and Phase Locked Loops for Stable Clock Sources Memory Cells Compiled to the Precise Requirements of the Design Compatible with Atmel’s Extensive Range of Microcontroller, DSP, Standard Interface and Application Specific Cells • High-Performance Analog Cells can be Developed on Request
• • • •
Cell-based ASIC ATC35 Summary
Description
The Atmel ATC35 (AT56K) process is a proprietary 0.
35 micron three-layer-metal CMOS process intended for use with a supply voltage of 3.
3V ± 0.
3V.
The following table shows the range for which Atmel library cells have been characterized.
Table 1.
Recommended Operating Conditions
Symbol VDD3 VDD5 VI VO TEMP Parameter DC Supply Voltage DC Supply Voltage DC Input Voltage DC Output Voltage Operating Free Air Temperature Range Industrial Conditions Core and Standard I/Os 5V Interface I/Os Min 3.
0 4.
5 0 0 -55 Typ 3.
3 5.
0 Max 3.
6 5.
5 VDD VDD +85 Unit V V V V
°C
The Atmel cell libraries and megacell compilers have been designed in order to be compatible with each other.
Simulation representations exist for three types of operating conditions.
They correspond to three characterization conditions defined as follows: • MIN conditions: TJ = -55°C VDD (cell) = 3.
60V Process = fast (industrial best case) • TYP conditions: TJ = +25°C VDD (cell) = 3.
30V Process = typ (industrial typical case) • MAX conditions: TJ = +100°C VDD (cell) = 3.
00V Process = slow (industrial worst case) Delays to tristate are defined as delay to turn off (VGS < VT) of the driving devices.
Output pad drain current corresponds to the output current of the pad when the output voltage is VOL or VOH.
The output resistor of the pad and the voltage drop due to access resistors (in and out of the die) are taken into account.
In order to have accurate timing estim...
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