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AE235RAA20N_SZ

Coilcraft

Outgassing Compliant Chip Inductors


AE235RAA20N_SZ
AE235RAA20N_SZ

PDF File AE235RAA20N_SZ PDF File


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0402 CHIP INDUCTORS OutgassingCompliantChipInductors AE235RAA ■ Exceptionally high Q factors ■ Outstanding self-resonant frequency ■ Tight inductance tolerance ■ High temperature materials allow operation in ambient temperatures up to 155°C.
■ Passes NASA low outgassing specifications ■ Leach-resistant base metalization with tin-lead (Sn-Pb) terminations ensures the best possible board adhesion Current Derating 120 110 100 Percent of rated Irms 90 80 70 60 50 Typical L vs Frequency 30 27 nH 25 30 20 10 0 -55 -40 Inductance (nH) 20 19 nH -20 0 20 25°C 40 40 60 80 100 120 140 160 Ambient temperature (°C) B overall C D I 15 12 nH 10 5.
6 nH H F 5 0 1 10 100 1000 10000 A 1 nH G F J I Frequency (MHz) Typical Q vs Frequency 120 110 100 90 80 12 nH 5.
6 nH 19 nH 27 nH 1 nH E terminal Terminal wraparound: approx 0.
007/0,18 both ends Suggested Land Pattern A B C D max max max ref E F G H I J 0.
047 0.
025 0.
026 0.
010 0.
020 0.
009 0.
022 0.
026 0.
014 0.
018 1,19 0,64 0,66 0,25 0,51 0,23 0,56 0,66 0,36 0,46 Note: Dimensions are before solder application.
For maximum overall dimensions including solder, add 0.
0025 in / 0,064 mm to B and 0.
006 in / 0,15 mm to A and C.
Q Factor 70 60 50 40 30 20 10 0 1 10 100 1000 10000 Core material Ceramic Terminations  Tin-lead (63/37) over silver-platinum-glass frit Ambient temperature  –55°C to +125°C with Imax current, +125°C to +155°C with derated current Storage temperature  Component: –55°C to +155°C.
Packaging: –55°C to +80°C Resistance to soldering heat  Max three 40 second reflows at +260°C, parts cooled to room temperature between cycles Temperature Coefficient of Inductance (TCL)  +25 to +155 ppm/°C Moisture Sensitivity Level (MSL)  1 (unlimited floor life at <30°C / 85% relative humidity) Enhanced crush-resistant packaging  2000 per 7″ reel Paper tape:  8 mm wide, 0.
68 mm thick, 2 mm pocket spacing ® Frequency (MHz) These parts are preproduction products for electrical evalu...



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