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HFA40HF120C

International Rectifier

Soft Recovery Diode


HFA40HF120C
HFA40HF120C

PDF File HFA40HF120C PDF File


Description
PD-91797 PRELIMINARY HFA40HF120C Ultrafast, Soft Recovery Diode VR = 1200V VF = 4.
46V Qrr = 370nC HEXFRED Features TM (ISOLATED BASE) • Reduced RFI and EMI • Reduced Snubbing • Extensive Characterization of Recovery Parameters • Hermetic • Surface Mount ANODE COMMON CATHODE ANODE di(rec)M/dt = 380A/µs Description HEXFRED diodes are optimized to reduce losses and EMI/RFI in high frequency power conditioning systems.
An extensive characterization of the recovery behavior for different values of current, temperature and di/dt simplifies the calculations of losses in the operating conditions.
The softness of the recovery eliminates the need for a snubber in most applications.
These devices are ideally suited for power converters, motors drives and other applications where switching losses are significant portion of the total losses.
TM SMD-1 Absolute Maximum Ratings (per Leg) Parameter VR IF @ TC = 100°C IFSM @ TC = 25°C PD @ TC = 25°C TJ TSTG D.
C.
Reverse Voltage Continuous Forward Current  Single Pulse Forward Current ‚ Maximum Power Dissipation Operating Junction and Storage Temperature Range Max.
1200 15 130 63 -55 to +150 Units V A W °C Thermal - Mechanical Characteristics Parameter RθJC Junction-to-Case, Single Leg Conducting Weight Typ.
— 2.
6 Max.
2.
0 — Units °C/W g Note:  D.
C.
= 50% rect.
wave ‚ 1/2 sine wave, 60 Hz , P.
W.
= 8.
33 ms www.
irf.
com 1 8/20/98 www.
DataSheet.
in HFA40HF120C Electrical Characteristics (per Leg) @ TJ = 25°C (unless otherwise specified) Parameter VBR VFM Cathode Anode Breakdown Voltage Max Forward Voltage Min.
Typ.
Max.
Units 1200 — — — — — — — — — — — — 10 — 2.
8 — 3.
3 4.
4 2.
8 10 1.
0 15 — V V µA mA pF nH Test Conditions IR = 250µA IF = 7.
0A IF = 15A See Fig.
1 IF = 7.
0A, TJ = 125°C VR = VR Rated See Fig.
2 TJ = 125°C, VR = 480V VR = 200V See Fig.
3 Measured from center of bond pad to end of anode bonding wire IRM CT LS Max Reverse Leakage Current Junction Capacitance Series Inductance Dynamic Recovery Characteri...



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