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TA78L015AP

Toshiba Semiconductor

(TA78L0xxAP) Three-Terminal Positive Regulators


TA78L015AP
TA78L015AP

PDF File TA78L015AP PDF File


Description
TA78L005,006,007,075,008,009,10,12,132,15,18,20,24AP TOSHIBA Bipolar Linear Integrated Circuit Silicon Monolithic TA78L005AP, TA78L006AP, TA78L007AP, TA78L075AP, TA78L008AP, TA78L009AP, TA78L010AP, TA78L012AP, TA78L132AP, TA78L015AP, TA78L018AP, TA78L020AP, TA78L024AP Three-Terminal Positive Regulators 5 V, 6 V, 7 V, 7.
5 V, 8 V, 9 V, 10 V, 12 V, 13.
2 V, 15 V, 18 V, 20 V, 24 V Features z Suitable for TTL, C2MOS power supply.
z Internal short-circuit current limiting.
z Internal thermal overload protection.
z Maximum output current of 150 mA (Tj = 25°C).
z Available in a plastic TO-92MOD package.
Pin Assignment Marking side 2 OUT 3 GND 1 IN Weight: 0.
36 g (Typ.
) Marking TA78L ***AP Part No.
(or abbreviation code) Lot No.
(weekly code) A line indicates lead (Pb)-free package or lead (Pb)-free finish.
www.
DataSheet4U.
com Equivalent Circuit 1 2006-11-02 TA78L005,006,007,075,008,009,10,12,132,15,18,20,24AP Absolute Maximum Ratings (Ta = 25°C) Characteristics TA78L005AP TA78L006AP TA78L007AP TA78L075AP TA78L008AP TA78L009AP Input voltage TA78L010AP TA78L012AP TA78L132AP TA78L015AP TA78L018AP TA78L020AP TA78L024AP Power dissipation Operating temperature Storage temperature Junction temperature Thermal resistance (Ta = 25°C) PD Topr Tstg Tj Rth (j-a) 800 −30~85 −55~150 150 156 mW °C °C °C °C/W 40 VIN 35 V Symbol Rating Unit Note: Using continuously under heavy loads (e.
g.
the application of high temperature/current/voltage and the significant change in temperature, etc.
) may cause this product to decrease in the reliability significantly even if the operating conditions (i.
e.
operating temperature/current/voltage, etc.
) are within the absolute maximum ratings and the operating ranges.
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook (“Handling Precautions”/Derating Concept and Methods) and individual reliability data (i.
e.
reliability test report and estimated failure rate, etc).
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