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TPCA8014-H

Toshiba Semiconductor

Silicon N-Channel MOSFET


TPCA8014-H
TPCA8014-H

PDF File TPCA8014-H PDF File


Description
TPCA8014-H TOSHIBA Field Effect Transistor Silicon N-Channel MOS Type (Ultra-High-Speed U-MOSIII) TPCA8014-H High-Efficiency DC/DC Converter Applications Notebook PC Applications Portable Equipment Applications 0.
5±0.
1 1.
27 0.
4±0.
1 8 5 Unit: mm 0.
05 M A 6.
0±0.
3 5.
0±0.
2 • Small footprint due to a small and thin package • High-speed switching • Small gate charge: Qsw = 7.
4 nC (typ.
) • Low drain-source ON-resistance: RDS (ON) = 7.
1 mΩ (typ.
) • High forward transfer admittance: |Yfs| = 47 S (typ.
) • Low leakage current: IDSS = 10 μA (max) (VDS = 40 V) • Enhancement mode: Vth = 1.
1 to 2.
3 V (VDS = 10 V, ID = 1 mA) 0.
15±0.
05 0.
95±0.
05 1 4 5.
0±0.
2 0.
595 A 0.
166±0.
05 S 0.
05 S 1 4 1.
1±0.
2 0.
6±0.
1 3.
5±0.
2 Absolute Maximum Ratings (Ta = 25°C) 4.
25±0.
2 Characteristic Drain-source voltage Drain-gate voltage (RGS = 20 kΩ) Gate-source voltage Drain current DC (Note 1) Pulsed (Note 1) Drain power dissipation (Tc = 25℃) Drain power dissipation (t = 10 s) (Note 2a) Drain power dissipation (t = 10 s) (Note 2b) Single-pulse avalanche energy (Note 3) Avalanche current Repetitive avalanche energy (Tc=25℃) (Note 4) Channel temperature Storage temperature range Symbol VDSS VDGR VGSS ID IDP PD PD PD EAS IAR EAR Tch Tstg Rating Unit 40 V 40 V ±20 V 30 A 90 45 W 2.
8 W 1.
6 W 84 mJ 30 A 2.
7 mJ 150 °C −55 to 150 °C 8 5 0.
8±0.
1 1,2,3:SOURCE 4:GATE 5,6,7,8:DRAIN JEDEC ― JEITA ― TOSHIBA 2-5Q1A Weight: 0.
068 g (typ.
) Circuit Configuration 8765 1234 Note: For Notes 1 to 5, refer to the next page.
Using continuously under heavy loads (e.
g.
the application of high temperature/current/voltage and the significant change in temperature, etc.
) may cause this product to decrease in the reliability significantly even if the operating conditions (i.
e.
operating temperature/current/voltage, etc.
) are within the absolute maximum ratings.
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Ha...



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