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H8S2315

Hitachi

(H8S23xx) 16-Bit Single-Chip Microcomputer


H8S2315
H8S2315

PDF File H8S2315 PDF File


Description
Hitachi 16-Bit Single-Chip Microcomputer H8S/2319, H8S/2318 Series, H8S/2319 F-ZTAT™, H8S/2318 F-ZTAT™, H8S/2315 F-ZTAT™ H8S/2319 H8S/2318 H8S/2317 H8S/2316 H8S/2315 H8S/2313 H8S/2312 H8S/2311 H8S/2310 HD64F2319 HD6432318, HD64F2318 HD6432317 HD6432316 HD64F2315 HD6432313 HD6412312 HD6432311 HD6412310 Reference Manual — Individual Product Specifications — ADE-602-188A Rev.
2.
0 8/24/00 Hitachi, Ltd.
www.
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DataSheet4U.
com Cautions 1.
Hitachi neither warrants nor grants licenses of any rights of Hitachi’s or any third party’s patent, copyright, trademark, or other intellectual property rights for information contained in this document.
Hitachi bears no responsibility for problems that may arise with third party’s rights, including intellectual property rights, in connection with use of the information contained in this document.
2.
Products and product specifications may be subject to change without notice.
Confirm that you have received the latest product standards or specifications before final design, purchase or use.
3.
Hitachi makes every attempt to ensure that its products are of high quality and reliability.
However, contact Hitachi’s sales office before using the product in an application that demands especially high quality and reliability or where its failure or malfunction may directly threaten human life or cause risk of bodily injury, such as aerospace, aeronautics, nuclear power, combustion control, transportation, traffic, safety equipment or medical equipment for life support.
4.
Design your application so that the product is used within the ranges guaranteed by Hitachi particularly for maximum rating, operating supply voltage range, heat radiation characteristics, installation conditions and other characteristics.
Hitachi bears no responsibility for failure or damage when used beyond the guaranteed ranges.
Even within the guaranteed ranges, consider normally foreseeable failure rates or failure modes in semiconductor devices and ...



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