8 Bit Sigle-Chip Microcontrollers
Description
User’s Manual
µPD789478 Subseries
8-Bit Single-Chip Microcontrollers
µPD789477 µPD789478 µPD789479 µPD78F9478 µPD78F9479
Document No.
U15400EJ3V0UD00 (3rd edition) Date Published May 2003 N CP(K)
Printed in Japan
©
2001
[MEMO]
2
User’s Manual U15400EJ3V0UD
NOTES FOR CMOS DEVICES
1 PRECAUTION AGAINST ESD FOR SEMICONDUCTORS Note: Strong electric field, when exposed to a MOS device, can cause destruction of the gate oxide and ultimately degrade the device operation.
Steps must be taken to stop generation of static electricity as much as possible, and quickly dissipate it once, when it has occurred.
Environmental control must be adequate.
When it is dry, humidifier should be used.
It is recommended to avoid using insulators that easily build static electricity.
Semiconductor devices must be stored and transported in an anti-static container, static shielding bag or conductive material.
All test and measurement tools including work bench and floor should be grounded.
The operator should be grounded using wrist strap.
Semiconductor devices must not be touched with bare hands.
Similar precautions need to be taken for PW boards with semiconductor devices on it.
2 HANDLING OF UNUSED INPUT PINS FOR CMOS Note: No connection for CMOS device inputs can be cause of malfunction.
If no connection is provided to the input pins, it is possible that an internal input level may be generated due to noise, etc.
, hence causing malfunction.
CMOS devices behave differently than Bipolar or NMOS devices.
Input levels of CMOS devices must be fixed high or low by using a pull-up or pull-down circuitry.
Each unused pin should be connected to V DD or GND with a resistor, if it is considered to have a possibility of being an output pin.
All handling related to the unused pins must be judged device by device and related specifications governing the devices.
3 STATUS BEFORE INITIALIZATION OF MOS DEVICES Note: Power-on does not necessarily define initial status of MOS device.
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