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2SK1544

Toshiba Semiconductor

Silicon N-Channel MOSFET


2SK1544
2SK1544

PDF File 2SK1544 PDF File


Description
2SK1544 TOSHIBA Field Effect Transistor Silicon N Channel MOS Type (π−MOSIII.
5) 2SK1544 DC−DC Converter and Motor Drive Applications Unit: mm z Low drain−source ON resistance : RDS (ON) = 0.
15 Ω (typ.
) z High forward transfer admittance : |Yfs| = 21 S (typ.
) z Low leakage current : IDSS = 300 μA (max) (VDS = 500 V) z Enhancement mode : Vth = 1.
5~3.
5 V (VDS = 10 V, ID = 1 mA) Absolute Maximum Ratings (Ta = 25°C) Characteristics Symbol Rating Unit Drain−source voltage Drain−gate voltage (RGS = 20 kΩ) Gate−source voltage Drain current DC (Note 1) Pulse (Note 1) Drain power dissipation (Tc = 25°C) Channel temperature Storage temperature range VDSS VDGR VGSS ID IDP PD Tch Tstg 500 500 ±30 25 100 200 150 −55~150 V V V A W °C °C JEDEC ― JEITA ― TOSHIBA 2-21F1B Weight: 9.
75 g (typ.
) Note: Using continuously under heavy loads (e.
g.
the application of high temperature/current/voltage and the significant change in temperature, etc.
) may cause this product to decrease in the reliability significantly even if the operating conditions (i.
e.
operating temperature/current/voltage, etc.
) are within the absolute maximum ratings.
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook (“Handling Precautions”/Derating Concept and Methods) and individual reliability data (i.
e.
reliability test report and estimated failure rate, etc).
Thermal Characteristics Characteristics Symbol Max Unit Thermal resistance, channel to case Thermal resistance, channel to ambient Rth (ch−c) Rth (ch−a) 0.
625 35.
7 °C / W °C / W Note 1: Ensure that the channel temperature does not exceed 150°C.
This transistor is an electrostatic-sensitive device.
Please handle with caution.
1 2006-11-02 Electrical Characteristics (Ta = 25°C) Characteristics Symbol Test Condition Gate leakage current Drain cut−off current Drain−source breakdown voltage Gate threshold voltage Drain−source ON resistance Forward transfer admittance In...



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