SCAN TEST DEVICE
Description
SN54ABT18245 SCAN TEST DEVICE WITH 18-BIT BUS TRANSCEIVERS
SGBS307A – AUGUST 1994 – REVISED JANUARY 1995
• Member of the Texas Instruments SCOPE ™
Family of Testability Products
• Member of the Texas Instruments
Widebus ™ Family
• Compatible With the IEEE Standard
1149.
1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture
• SCOPE ™ Instruction Set
– IEEE Standard 1149.
1-1990 Required Instructions, CLAMP and HIGHZ
– Parallel-Signature Analysis at Inputs – Pseudo-Random Pattern Generation
From Outputs – Sample Inputs/Toggle Outputs – Binary Count From Outputs – Device Identification – Even-Parity Opcodes
• State-of-the-Art EPIC-ΙΙB™ BiCMOS Design
Significantly Reduces Power Dissipation
• Packaged in 380-mil Fine-Pitch
Ceramic Flat Packages Using 25-mil Center-to-Center Spacings
description
The SN54ABT18245 scan test device with 18-bit bus transceivers is a member of the Texas Instruments SCOPE™ testability integrated circuit family.
This family of devices supports IEEE Standard 1149.
1-1990 boundary scan to facilitate testing of complex circuit-board assemblies.
Scan access to the test circuitry is accomplished via the 4-wire test access port (TAP) interface.
SN54ABT18245 .
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WD PACKAGE (TOP VIEW)
1DIR 1B1 1B2 GND 1B3 1B4 VCC 1B5 1B6 1B7 GND 1B8 1B9 2B1 2B2 2B3 2B4 GND 2B5 2B6 2B7 VCC 2B8 2B9 GND
2DIR TDO TMS
1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28
56 1OE 55 1A1 54 1A2 53 GND 52 1A3 51 1A4 50 VCC 49 1A5 48 1A6 47 1A7 46 GND 45 1A8 44 1A9 43 2A1 42 2A2 41 2A3 40 2A4 39 GND 38 2A5 37 2A6 36 2A7 35 VCC 34 2A8 33 2A9 32 GND 31 2OE 30 TDI 29 TCK
In the normal mode, this device contains 18-bit noninverting bus transceivers.
It can be used either as two 9-bit transceivers or one 18-bit transceiver.
The test circuitry can be activated by the TAP to take snapshot samples of the data appearing at the device pins or to perform a self test on the boundary-test cells.
Activating the TAP in the normal mode does not affect the funct...
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