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ADS7842

Burr-Brown Corporation

12-Bit/ 4-Channel Parallel Output Sampling ANALOG-TO-DIGITAL CONVERTER


ADS7842
ADS7842

PDF File ADS7842 PDF File


Description
ADS7842 ADS7842 SBAS103C – SEPTEMBER 2000 – REVISED OCTOBER 2006 12-Bit, 4-Channel Parallel Output Sampling ANALOG-TO-DIGITAL CONVERTER FEATURES q SINGLE SUPPLY: 2.
7V to 5V q 4-CHANNEL INPUT MULTIPLEXER q UP TO 200kHz SAMPLING RATE q FULL 12-BIT PARALLEL INTERFACE q ±1LSB INL AND DNL q NO MISSING CODES q 72dB SINAD q LOW POWER: 2mW q SSOP-28 PACKAGE APPLICATIONS q DATA ACQUISITION q TEST AND MEASUREMENT q INDUSTRIAL PROCESS CONTROL q MEDICAL INSTRUMENTS q LABORATORY EQUIPMENT DESCRIPTION The ADS7842 is a complete, 4-channel, 12-bit Analog-toDigital Converter (ADC).
It contains a 12-bit, capacitorbased, Successive Approximation Register (SAR) ADC with a sample-and-hold amplifier, interface for microprocessor use, and parallel, 3-state output drivers.
The ADS7842 is specified at a 200kHz sampling rate while dissipating only 2mW of power.
The reference voltage can be varied from 100mV to VCC with a corresponding LSB resolution from 24µV to 1.
22mV.
The ADS7842 is tested down to 2.
7V operation.
Low power, high speed, and an onboard multiplexer make the ADS7842 ideal for battery-operated systems such as portable, multi-channel dataloggers and measurement equipment.
The ADS7842 is available in an SSOP-28 package and is tested over the –40°C to +85°C temperature range.
AIN0 AIN1 AIN2 AIN3 VREF A0 A1 4-Channel MUX SAR ADS7842 CDAC Comparator Output Latches and 3-State Drivers 3-State Parallel Data Bus CLK BUSY WR CS RD Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
All trademarks are the property of their respective owners.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments standard warranty.
Production processing does not necessarily include testing of all parameters.
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