INSULATED GATE BIPOLAR TRANSISTOR WITH ULTRAFAST SOFT RECOVERY DIODE
Features • Low VCE (on) Trench IGBT Technology • Lo...
INSULATED GATE BIPOLAR
TRANSISTOR WITH ULTRAFAST SOFT RECOVERY DIODE
Features Low VCE (on) Trench IGBT Technology Low Switching Losses Maximum Junction temperature 175 °C 5µs SCSOA Square RBSOA 100% of the parts tested for ILM Positive VCE (on) Temperature Coefficient. Ultra Fast Soft Recovery Co-pak Diode Tighter Distribution of Parameters Lead-Free Package
Benefits High Efficiency in a Wide Range of Applications Suitable for a Wide Range of Switching Frequencies due
to Low VCE (ON) and Low Switching Losses Rugged Transient Performance for Increased Reliability Excellent Current Sharing in Parallel Operation Low EMI
PD - 97269A
IRGB4045DPbF
C
G E
n-channel
C
VCES = 600V IC = 6.0A, TC = 100°C tsc > 5µs, Tjmax = 175°C
VCE(on) typ. = 1.7V
G
Gate
E C G
TO-220AB
C
Collector
E
Emitter
Absolute Maximum Ratings
Parameter
VCES IC@ TC = 25°C IC@ TC = 100°C ICM ILM IF@TC=25°C IF@TC=100°C IFM
VGE
Collector-to-Emitter Breakdown Voltage Continuous Collector Current
Continuous Collector Current
cPulsed Collector Current, VGE = 15V
Clamped Inductive Load Current, VGE = 20V Diode Continuous Forward Current
Diode Continuous Forward Current
dDiode Maximum Forward Current
Continuous Gate-to-Emitter Voltage Transient Gate-to-Emitter Voltage
PD @ TC =25° PD @ TC =100° TJ TSTG
Maximum Power Dissipation Maximum Power Dissipation Operating Junction and Storage Temperature Range Soldering Temperature, for 10 seconds
Thermal Resistance
RθJC RθJC RθCS RθJA...