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1SS181 Dataheets PDF



Part Number 1SS181
Manufacturers Toshiba Semiconductor
Logo Toshiba Semiconductor
Description SILICON DIODE
Datasheet 1SS181 Datasheet1SS181 Datasheet (PDF)

TOSHIBA Diode Silicon Epitaxial Planar Type 1SS181 1SS181 Ultra High Speed Switching Application Unit: mm z Small package : SC-59 z Low forward voltage : VF (3) = 0.92V (Typ.) z Fast reverse recovery time : trr = 1.6ns (Typ.) z Small total capacitance : CT = 2.2pF (Typ.) Absolute Maximum Ratings (Ta = 25°C) Characteristic Symbol Rating Unit Maximum (peak) reverse voltage Reverse voltage Maximum (peak) forward current Average forward current VRM VR IFM IO 85 80 300 (*) 100 (*) V.

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TOSHIBA Diode Silicon Epitaxial Planar Type 1SS181 1SS181 Ultra High Speed Switching Application Unit: mm z Small package : SC-59 z Low forward voltage : VF (3) = 0.92V (Typ.) z Fast reverse recovery time : trr = 1.6ns (Typ.) z Small total capacitance : CT = 2.2pF (Typ.) Absolute Maximum Ratings (Ta = 25°C) Characteristic Symbol Rating Unit Maximum (peak) reverse voltage Reverse voltage Maximum (peak) forward current Average forward current VRM VR IFM IO 85 80 300 (*) 100 (*) V V mA mA Surge current (10ms) Power dissipation IFSM 2 (*) A P 150 mW Junction temperature Storage temperature Tj 125 °C Tstg −55 to 125 °C Note: Using continuously under heavy loads (e.g. the application of high JEDEC TO-236MOD temperature/current/voltage and the significant change in JEITA SC-59 temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum TOSHIBA 1-3G1E Weight: 0.012g (typ.) ratings. Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook (“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test report and estimated failure rate, etc). *: Unit rating. Total rating = Unit rating × 1.5. Electrical Characteristics Characteristic Forward voltage Reverse current Total capacitance Reverse recovery time Symbol VF (1) VF (2) VF (3) IR (1) IR (2) CT trr Test Circuit Test Condition ― IF = 1mA ― IF = 10mA ― IF = 100mAs ― VR = 30V ― VR = 80V ― VR = 0, f = 1MHz ― IF = 10mA (Fig.1) Min Typ. Max Unit ― 0.61 ― ― 0.74 ― V ― 0.92 1.20 ― ― 0.1 μA ― ― 0.5 ― 2.2 4.0 pF ― 1.6 4.0 ns Marking Start of commercial production 1982-06 1 2014-03-01 1SS181 Fig.1 Reverse recovery time (trr) test circuit 2 2014-03-01 1SS181 RESTRICTIONS ON PRODUCT USE • Toshiba Corporation, and its subsidiaries and affiliates (collectively "TOSHIBA"), reserve the right to make changes to the information in this document, and related hardware, software and systems (collectively "Product") without notice. • This document and any information herein may not be reproduced without prior written permission from TOSHIBA. Even with TOSHIBA's written permission, reproduction is permissible only if reproduction is without alteration/omission. • Though TOSHIBA works continually to improve Product's quality and reliability, Product can malfunction or fail. Customers are responsible for complying with safety standards and for providing adequate designs and safeguards for their hardware, software and systems which minimize risk and avoid situations in which a malfunction or failure of Product could cause loss of human life, bodily injury or damage to property, including data loss or corruption. Before customers use the Product, create designs including the Product, or incorporate the Product into their own applications, customers must also refer to and comply with (a) the latest versions of all relevant TOSHIBA information, including without limitation, this document, the specifications, the data sheets and application notes for Product and the precautions and conditions set forth in the "TOSHIBA Semiconductor Reliability Handbook" and (b) the instructions for the application with which the Product will be used with or for. Customers are solely responsible for all aspects of their own product design or applications, including but not limited to (a) determining the appropriateness of the use of this Product in such design or applications; (b) evaluating and determining the applicability of any information contained in this document, or in charts, diagrams, programs, algorithms, sample application circuits, or any other referenced documents; and (c) validating all operating parameters for such designs and applications. TOSHIBA ASSUMES NO LIABILITY FOR CUSTOMERS' PRODUCT DESIGN OR APPLICATIONS. • PRODUCT IS NEITHER INTENDED NOR WARRANTED FOR USE IN EQUIPMENTS OR SYSTEMS THAT REQUIRE EXTRAORDINARILY HIGH LEVELS OF QUALITY AND/OR RELIABILITY, AND/OR A MALFUNCTION OR FAILURE OF WHICH MAY CAUSE LOSS OF HUMAN LIFE, BODILY INJURY, SERIOUS PROPERTY DAMAGE AND/OR SERIOUS PUBLIC IMPACT ("UNINTENDED USE"). Except for specific applications as expressly stated in this document, Unintended Use includes, without limitation, equipment used in nuclear facilities, equipment used in the aerospace industry, medical equipment, equipment used for automobiles, trains, ships and other transportation, traffic signaling equipment, equipment used to control combustions or explosions, safety devices, elevators and escalators, devices related to electric power, and equipment used in finance-related fields. IF YOU USE PRODUCT FOR UNINTENDED USE, TOSHIBA ASSUMES NO LIABILITY FOR PRODUCT. For details, please contact your TOSHIBA sales representative. • Do not disassemble, analyze, reverse-engineer, alter, modif.


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