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NIV1161

ON Semiconductor

ESD Protection

ESD Protection with Automotive Short-toBattery Blocking Low Capacitance ESD Protection with short−to−battery blocking fo...


ON Semiconductor

NIV1161

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Description
ESD Protection with Automotive Short-toBattery Blocking Low Capacitance ESD Protection with short−to−battery blocking for Automotive High Speed Data Lines NIx1161 Series The NIx1161 series is designed to protect high speed data lines from ESD as well as short to vehicle battery situations. The ultra−low capacitance and low ESD clamping voltage make this device an ideal solution for protecting voltage sensitive high speed data lines while the low RDS(on) FET limits distortion on the signal lines. The flow−through style package allows for easy PCB layout and matched trace lengths necessary to maintain consistent impedance between high speed differential lines such as USB and LVDS protocols. Features Low Capacitance (0.65 pF Typical, I/O to GND) Protection for the Following Standards: IEC 61000−4−2 (Level 4) & ISO 10605 Integrated MOSFETs: ♦ Short−to−Battery Blocking ♦ Short−to−USB VBUS Blocking NIV1161MTWTAG − Wettable Flanks Device for optimal Automated Optical Inspection (AOI) NIV Prefix for Automotive and Other Applications Requiring Unique Site and Control Change Requirements; AEC−Q101 Qualified and PPAP Capable These Devices are Pb−Free, Halogen Free/BFR Free and are RoHS Compliant Typical Applications Automotive High Speed Signal Pairs USB 2.0 LVDS ABSOLUTE MAXIMUM RATINGS (TJ = 25°C unless otherwise noted) Rating Symbol Value Unit Operating Junction Temperature Range TJ(max) −55 to +150 °C Storage Temperature Range TSTG −55 to +150 °C Drain−...




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