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TC74AC393FT Dataheets PDF



Part Number TC74AC393FT
Manufacturers Toshiba Semiconductor
Logo Toshiba Semiconductor
Description Dual Binary Counter
Datasheet TC74AC393FT DatasheetTC74AC393FT Datasheet (PDF)

TC74AC393P/F/FT TOSHIBA CMOS Digital Integrated Circuit Silicon Monolithic TC74AC393P, TC74AC393F, TC74AC393FT Dual Binary Counter The TC74AC393 is an advanced high speed CMOS 4-BIT BINARY COUNTER fabricated with silicon gate and double-layer metal wiring C2MOS technology. It achieves the high speed operation similar to equivalent Bipolar Schottky TTL while maintaining the CMOS low power dissipation. It contains two independent counter circuits in one package, so that counting or frequency divi.

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TC74AC393P/F/FT TOSHIBA CMOS Digital Integrated Circuit Silicon Monolithic TC74AC393P, TC74AC393F, TC74AC393FT Dual Binary Counter The TC74AC393 is an advanced high speed CMOS 4-BIT BINARY COUNTER fabricated with silicon gate and double-layer metal wiring C2MOS technology. It achieves the high speed operation similar to equivalent Bipolar Schottky TTL while maintaining the CMOS low power dissipation. It contains two independent counter circuits in one package, so that counting or frequency division of eight binary bits can be achieved with one IC. This device changes state on the negative going transition of the CLOCK pulse. The counter can be reset to “0” (QA to QD = “L”) by a high at the CLEAR input regardless of other inputs. All inputs are equipped with protection circuits against static discharge or transient excess voltage. Features • High speed: fmax = 180 MHz (typ.) at VCC = 5 V • Low power dissipation: ICC = 8 μA (max) at Ta = 25°C • High noise immunity: VNIH = VNIL = 28% VCC (min) • Symmetrical output impedance: |IOH| = IOL = 24 mA (min) Capability of driving 50 Ω transmission lines. • Balanced propagation delays: tpLH ∼− tpHL • Wide operating voltage range: VCC (opr) = 2 to 5.5 V • Pin and function compatible with 74F393 TC74AC393P TC74AC393F TC74AC393FT Weight DIP14-P-300-2.54 SOP14-P-300-1.27A TSSOP14-P-0044-0.65A : 0.96 g (typ.) : 0.18 g (typ.) : 0.06 g (typ.) Start of commercial production 1988-10 1 2014-03-01 Pin Assignment 1CK 1 1CLR 2 1QA 3 1QB 4 1QC 5 1QD 6 GND 7 (top view) 14 VCC 13 2CK 12 2CLR 11 2QA 10 2QB 9 2QC 8 2QD Truth Table Inputs Outputs CK CLR QA QB QC QD X H L L L L L Count Up L No Change X: Don’t care Timing Chart CK CLR QA QB QC QD TC74AC393P/F/FT IEC Logic Symbol 1CLR (2) 1CK (1) 2CLR (12) CTRDIV 16 0 CT = 0 CT + 3 2CK (13) (3) 1QA (4) 1QB (5) 1QC (6) 1QD (11) 2QA (10) 2QB (9) 2QC (8) 2QD 2 2014-03-01 System Diagram TC74AC393P/F/FT 1/13 CK 2/12 CLR D CK Q R D CK Q R D CK Q R D CK Q R 3/11 QA 4/10 QB 5/9 QC 6/8 QD Absolute Maximum Ratings (Note 1) Characteristics Symbol Rating Unit Supply voltage range DC input voltage DC output voltage Input diode current Output diode current DC output current DC VCC/ground current Power dissipation Storage temperature VCC VIN VOUT IIK IOK IOUT ICC PD Tstg −0.5 to 7.0 V −0.5 to VCC + 0.5 V −0.5 to VCC + 0.5 V ±20 mA ±50 mA ±50 mA ±200 mA 500 (DIP) (Note 2)/180 (SOP/TSSOP) mW −65 to 150 °C Note 1: Exceeding any of the absolute maximum ratings, even briefly, lead to deterioration in IC performance or even destruction. Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum ratings and the operating ranges. Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook (“Handling Precautions”/Derating Concept and Methods) and individual reliability data (i.e. reliability test report and estimated failure rate, etc). Note 2: 500 mW in the range of Ta = −40 to 65°C. From Ta = 65 to 85°C, a derating factor of −10 mW/°C should be applied up to 300 mW. Operating Ranges (Note) Characteristics Symbol Rating Unit Supply voltage Input voltage Output voltage Operating temperature Input rise and fall time VCC VIN VOUT Topr dt/dV 2.0 to 5.5 0 to VCC 0 to VCC −40 to 85 0 to 100 (VCC = 3.3 ± 0.3 V) 0 to 20 (VCC = 5 ± 0.5 V) V V V °C ns/V Note: The operating ranges must be maintained to ensure the normal operation of the device. Unused inputs must be tied to either VCC or GND. 3 2014-03-01 TC74AC393P/F/FT Electrical Characteristics DC Characteristics Characteristics Symbol High-level input voltage VIH Test Condition ― Ta = Ta = 25°C −40 to 85°C Unit VCC (V) Min Typ. Max Min Max 2.0 1.50 ― ― 1.50 ― 3.0 2.10 ― ― 2.10 ― V 5.5 3.85 ― ― 3.85 ― Low-level input voltage VIL 2.0 ― ― 0.50 ― 0.50 ― 3.0 ― ― 0.90 ― 0.90 V 5.5 ― ― 1.65 ― 1.65 2.0 1.9 2.0 ― 1.9 ― High-level output voltage VOH IOH = −50 μA VIN = VIH or VIL IOH = −4 mA IOH = −24 mA 3.0 2.9 3.0 ― 2.9 ― 4.5 4.4 4.5 ― 4.4 ― V 3.0 2.58 ― ― 2.48 ― 4.5 3.94 ― ― 3.80 ― IOH = −75 mA (Note) 5.5 ― ― ― 3.85 ― 2.0 ― 0.0 0.1 ― 0.1 Low-level output voltage Input leakage current IOL = 50 μA 3.0 ― 0.0 0.1 ― 0.1 VIN VOL = VIH or VIL IOL = 12 mA 4.5 ― 0.0 0.1 ― 0.1 V 3.0 ― ― 0.36 ― 0.44 IOL = 24 mA 4.5 ― ― 0.36 ― 0.44 IOL = 75 mA (Note) 5.5 ― ― ― ― 1.65 IIN VIN = VCC or GND 5.5 ― ― ±0.1 ― ±1.0 μA Quiescent supply current ICC VIN = VCC or GND .


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