NX3225GA-26.000MHz-EXS00A-CG0197
Quartz Crystal Units
Specification of Quartz Crystal Units
1 NDK Part Number 2 NDK Specification Number 3 Type
4 Chipset Maker 5 Applicatio...
Description
Specification of Quartz Crystal Units
1 NDK Part Number 2 NDK Specification Number 3 Type
4 Chipset Maker 5 Application 6 Chipset Name 7 Chipset Number 8 End User
9 Electrical Characteristics 9.1 Nominal Frequency (f nom)
9.2 Overtone order 9.3 Frequency Tolerance 9.4 Frequency Versus
Temperature Characteristics 9.5 Equivalent Series Resistance (R r ) 9.6 Shunt Capacitance (C 0) 9.7 Motional Capacitance (C 1) 9.8 Motional Inductance (L 1) 9.9 Pulling Sensitiviity
9.10 Maximum Drive Level
10 Measurement Circuit 10.1 Frequency Measurement 10.1.1 Measuring Instrument 10.1.2 Load Capacitance (CL) 10.1.3 Level of Drive
10.2 Equivalent Resistance Measurement 10.2.1 Measuring Instrument 10.2.2 Load Capacitance (CL) 10.2.3 Level of Drive
11 Operable Temperature Range 12 Storage Temperature Range
13 Dimension
(Unit: mm)
NX3225GA-26.000MHz-EXS00A-CG01972 EXS00A-CG01972 NX3225GA
TEXAS INSTRUMENTS Smart meter , Zigbee NA Smart meter: CC430 , Zigbee:CC1101 Smart Grid market
26.000 MHz Fundamental ± 20 x 10-6 max. ( +25 °C ) ± 40 x 10-6 max. ( -40 ~ +85 °C ) The reference temperature shall be +25 °C 50 Ω max. 1.2 ± 0.3 pF 4.8 fF ± 30 % 7.8 mH ± 30 % 19.1 x 10-6 /pF ± 30 % ( where CL = 10 pF ) 200 μW max.
π-network (IEC) 10 pF 10 μW
π-network (IEC) Series 10 μW -40 ~ +85 °C -40 ~ +85 °C
Land Pattern (Typical)
Terminal Land Connection ( Top View)
Au plating on Ni pre plating Ni : plating 2 to 9μm Au : Plating 0.3 to 0.7μm
Jul.8.2010
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