SSM3K35FS
TOSHIBA Field-Effect Transistor Silicon N-Channel MOS Type
SSM3K35FS
○ High-Speed Switching Applications ○ An...
SSM3K35FS
TOSHIBA Field-Effect
Transistor Silicon N-Channel MOS Type
SSM3K35FS
○ High-Speed Switching Applications ○ Analog Switch Applications
1.2-V drive Low ON-resistance: Ron = 20 Ω (max) (@VGS = 1.2 V)
: Ron = 8 Ω (max) (@VGS = 1.5 V) : Ron = 4 Ω (max) (@VGS = 2.5 V) : Ron = 3 Ω (max) (@VGS = 4.0 V)
Unit: mm
Absolute Maximum Ratings (Ta = 25˚C)
Characteristics
Symbol
Rating
Unit
Drain–source voltage
VDSS
20
V
Gate–source voltage
VGSS
±10
V
Drain current
DC
ID
Pulse
IDP
180 mA
360
Drain power dissipation
PD
100
mW
Channel temperature
Tch
150
°C
Storage temperature
Tstg
−55 to 150
°C
JEDEC
-
Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the significant change in
JEITA
-
temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum
TOSHIBA
2-2H1B
Weight: 2.4 mg (typ.)
ratings.
Please design the appropriate reliability upon reviewing the Toshiba
Semiconductor Reliability Handbook (“Handling Precautions”/“Derating Concept and Methods”) and individual
reliability data (i.e. reliability test report and estimated failure rate, etc).
Electrical Characteristics (Ta = 25°C)
Characteristics
Symbol
Test Condition
Min Typ. Max Unit
Gate leakage current Drain–source breakdown voltage Drain cutoff current Gate threshold voltage Forward...