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NVMFD5877NL

ON Semiconductor

Dual N-Channel Power MOSFET

NVMFD5877NL MOSFET – Power, Dual N-Channel, Logic Level, Dual SO8FL 60 V, 39 mW, 17 A Features • Low RDS(on) to Minimi...


ON Semiconductor

NVMFD5877NL

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NVMFD5877NL MOSFET – Power, Dual N-Channel, Logic Level, Dual SO8FL 60 V, 39 mW, 17 A Features Low RDS(on) to Minimize Conduction Losses Low Capacitance to Minimize Driver Losses NVMFD5877NLWF − Wettable Flanks Option for Enhanced Optical Inspection AEC−Q101 Qualified and PPAP Capable These Devices are Pb−Free, Halogen Free and are RoHS Compliant MAXIMUM RATINGS (TJ = 25°C unless otherwise noted) Parameter Symbol Value Unit Drain−to−Source Voltage VDSS 60 V Gate−to−Source Voltage VGS "20 V Continuous Drain Cur- Tmb = 25°C ID rent RYJ−mb (Notes 1, 2, 3, 4) Steady Tmb = 100°C Power Dissipation State Tmb = 25°C PD RYJ−mb (Notes 1, 2, 3) Tmb = 100°C 17 A 12 23 W 12 Continuous Drain Cur- TA = 25°C ID rent RqJA (Notes 1 & 3, 4) Steady TA = 100°C Power Dissipation RqJA (Notes 1, 3) State TA = 25°C PD TA = 100°C 6 A 5 3.2 W 1.6 Pulsed Drain Current TA = 25°C, tp = 10 ms IDM 74 A Operating Junction and Storage Temperature TJ, Tstg −55 to °C +175 Source Current (Body Diode) Single Pulse Drain− to−Source Avalanche Energy (TJ = 25°C, VDD = 24 V, VGS = 10 V, RG = 25 W) (IL(pk) = 14.5 A, L = 0.1 mH) (IL(pk) = 6.3 A, L = 2 mH) Lead Temperature for Soldering Purposes (1/8″ from case for 10 s) IS 19 A EAS 10.5 mJ 40 TL 260 °C Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality should not be assumed, damage may occur and reliability m...




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