Document
LIGITEK ELECTRONICS CO.,LTD. www.DataSheet4U.com Property of Ligitek Only SQUARE WITH 4LEADS TYPE LED LAMPS
Pb
Lead-Free Parts
LUR9653H-30B-WJ
DATA SHEET
DOC. NO : REV. DATE :
QW0905-LUR9653H-30B-WJ C
: 13 - Oct. - 2006
LIGITEK ELECTRONICS CO.,LTD. Property of Ligitek Only
www.DataSheet4U.com
PART NO. LUR9653H-30B-WJ
Page 1/6
Package Dimensions
C1.25 R0.7
CATHODE
7.62¡Ó 0.5
ANODE
7.62¡Ó 0.5
£r 3.0
1.9 2.5¡Ó 0.5 0.4 4.4¡Ó 0.5 0.5
1.55
3.5¡Ó 0.5
5.08 ¡Ó 0.3
5.08
Note : 1.All dimension are in millimeter tolerance is ¡Ó 0.25mm unless otherwise noted. 2.Specifications are subject to change without notice.
Directivity Radiation
0¢X -30¢X 30¢X
-60¢X
60¢X
100% 75% 50%
25%
0
25%
50% 75% 100%
LIGITEK ELECTRONICS CO.,LTD. Property of Ligitek Only
PART NO. LUR9653H-30B-WJ
www.DataSheet4U.com
Page 2/6
Absolute Maximum Ratings at Ta=25 ¢J
Ratings Parameter Symbol UR(H) Forward Current Peak Forward Current Duty 1/10@10KHz Power Dissipation Reverse Current @5V Electrostatic Discharge( * ) Operating Temperature Storage Temperature IF IFP PD Ir ESD Topr Tstg 70 100 130 10 2000 -40 ~ +85 -40 ~ +100 mA mA mW UNIT
£g A V ¢J ¢J
Static Electricity or power surge will damage the LED. Use of a conductive wrist band or anti-electrosatic * glove is recommended when handing these LED. All devices, equipment and machinery must be properly grounded.
Typical Electrical & Optical Characteristics (Ta=25 ¢J )
COLOR PART NO MATERIAL Emitted
LUR9653H-30B-WJ AlGaInP/GaP Red
Forward Dominant Spectral voltage wave halfwidth @70mA(V) length ¡µ£f nm £f Dnm
Luminous Flux @70mA(lm)
Viewing angle 2£c 1/2 (deg)
Lens
Water Clear
Min. Max. Min. 630 20 2.3 3.2 3.5
Typ. 5.8 70
Note : 1.The forward voltage data did not including ¡Ó 0.1V testing tolerance. 2. The luminous intensity data did not including ¡Ó 15% testing tolerance.
LIGITEK ELECTRONICS CO.,LTD. Property of Ligitek Only
www.DataSheet4U.com
PART NO. LUR9653H-30B-WJ
Page 3/6
Initial Electrical/Optical Characteristics(at 70mA)
Luminous Flux Ranks
Item Rank F12 Luminous Flux Rank F13 Rank F14 Rank F15
* Luminous Flux Measurement allowance is ±10%
Min. 2.9 3.8 4.9 6.3
Max. 3.8 4.9 6.3 8.2
Unit
lm
LIGITEK ELECTRONICS CO.,LTD. Property of Ligitek Only
PART NO. LUR9653H-30B-WJ
www.DataSheet4U.com
Page 4/6
Typical Electro-Optical Characteristics Curve
UR(H) CHIP
Fig.1 Forward current vs. Forward Voltage
1000
Fig.2 Relative Intensity vs. Forward Current
3.5
Forward Current(mA)
100 10
Relative Intensity Normalize @20mA
1.0 1.5 2.0 2.5 3.0
3.0 2.5 2.0 1.5 1.0 0.5 0.0 1 10 100 1000
1 01
Forward Voltage(V) Fig.3 Forward Voltage vs. Temperature
1.2
Forward Current(mA) Fig.4 Relative Intensity vs. Temperature
Forward Voltage@20mA Normalize @25 ¢J
Relative Intensity@20mA Normalize @25¢J
-40 -20 0 20 40 60 80 100
3.0 2.5 2.0 1.5 1.0 0.5 0.0 -40 -20 0 20 40 60 80 100
1.1
1.0
0.9
0.8
Ambient Temperature( ¢J )
Ambient Temperature( ¢J )
Fig.5 Relative Intensity vs. Wavelength
Relative Intensity@20mA
1.0
0.5
0.0 550 600 650 700
Wavelength (nm)
LIGITEK ELECTRONICS CO.,LTD. Property of Ligitek Only
www.DataSheet4U.com
PART NO. LUR9653H-30B-WJ
Page 5/6
Soldering Condition(Pb-Free) 1.Iron: Soldering Iron:30W Max Temperature 350°C Max Soldering Time:3 Seconds Max(One Time) Distance:2mm Min(From solder joint to body)
2.Wave Soldering Profile Dip Soldering Preheat: 120° C Max Preheat time: 60seconds Max Ramp-up 2°C/sec(max) Ramp-Down:-5°C/sec(max) Solder Bath:260° C Max Dipping Time:3 seconds Max Distance:2mm Min(From solder joint to body)
Temp(° C) 260° C3sec Max
260¢X
5° /sec max
120¢X
2° /sec max Preheat 60 Seconds Max
25¢X 0¢X 0
50
100
150
Time(sec)
LIGITEK ELECTRONICS CO.,LTD. Property of Ligitek Only
PART NO. LUR9653H-30B-WJ
www.DataSheet4U.com
Page 6/6
Reliability Test:
Test Item
Test Condition
1.Under Room Temperature 2.If=20mA 3.t=1000 hrs (-24hrs, +72hrs)
Description
This test is conducted for the purpose of detemining the resistance of a part in electrical and themal stressed.
Reference Standard
MIL-STD-750: 1026 MIL-STD-883: 1005 JIS C 7021: B-1
Operating Life Test
High Temperature Storage Test
1.Ta=105 ¢J¡Ó 5 ¢J 2.t=1000 hrs (-24hrs, +72hrs)
The purpose of this is the resistance of the device which is laid under condition of high temperature for hours.
MIL-STD-883:1008 JIS C 7021: B-10
Low Temperature Storage Test
1.Ta=-40 ¢J¡Ó 5¢J 2.t=1000 hrs (-24hrs, +72hrs)
The purpose of this is the resistance of the device which is laid under condition of low temperature for hours.
JIS C 7021: B-12
High Temperature High Humidity Test
1.Ta=65 ¢J¡Ó 5¢J 2.RH=90 %~95% 3.t=240hrs ¡Ó 2hrs
The purpose of this test is the resistance of the device under tropical for hours.
MIL-STD-202:103B JIS C 7021: B-11
Thermal Shock Test
1.Ta=105 ¢J¡Ó 5¢J &-40 ¢J¡Ó (10min) (10min) 2.total 10 cycles
5¢J
The purpose of this is the resistance of the device to sudden extreme changes in high and low temperature. This test intended to .