High capacitance 3-terminal capacitors
MARUWA GENERAL CATALOG
PERFORMANCE AND TEST METHOD
www.DataSheet4U.com
EMI FILTERS
Item Dissipation Factor
Withstandi...
Description
MARUWA GENERAL CATALOG
PERFORMANCE AND TEST METHOD
www.DataSheet4U.com
EMI FILTERS
Item Dissipation Factor
Withstanding voltage Insulation resistance
Adhesion strength of termination
Vibration resistance
Resistance to soldering
heat
Visual Capacitance Dissipation factor
Visual Capacitance Dissipation factor Insulation resistance Withstanding voltage
Solderability
Temperature cycling
Humidity load test
Life test at high temperature
load
Visual Capacitance Dissipation factor Insulation resistance Withstanding voltage
Visual Capacitance Dissipation factor Insulation resistance
Visual Capacitance Dissipation factor Insulation resistance
Flexion
Visual Capacitance
CG, UJ
Performance
2.5% or less ء1)
R
Testing method and conditions F (In accordance with JIS C5101-1)
5% or less ء1)
CG : 1MHz
UJ, R, F
: 1kHz
Measurement voltage : 0.5~2Vrms
No insulation breakdown and no failure. No less than 10,000M⍀ or 500M⍀ F, whichever is smaller.
Application time is 1~5seconds. CG, UJ : 300% of rated voltage R, F : 250% of rated voltage
Rated voltage is applied for 1 minute.
Chip 5N Substrate
No peeling-off or exfoliation shall be manifest or recognizable in its incipient stages.
Solder a specimen on the testing jig shown on the left and apply a force of 5N (0.51kgf) in the direction indicated by arrow.
No remarkable damage
Within specified tolerance
Initial standard values must be satisfied.
No remarkable damage
No more than ȗ2.5% or ȗ0.25pF, whichever is la...
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