v5.3 www.DataSheet4U.com
RTAX-S/SL RadTolerant FPGAs
Radiation Performance
SEU-Hardened Registers Eliminate the Need for TripleModule Redundancy (TMR) – Immune to Single-Event Upsets (SEU) to LETTH > 37 MeV-cm2/mg – SEU Rate < 10-10 Errors/Bit-Day in Worst-Case Geosynchronous Orbit Expected SRAM Upset Rate of <10-10 Errors/Bit-Day with Use of Error Detect...
