Document
ADC16V130 16-Bit, 130 MSPS A/D Converter with LVDS Outputs
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April 8, 2009
ADC16V130
■ Offset binary or 2's complement data format ■ Full data rate LVDS output port ■ 64-pin LLP package (9x9x0.8, 0.5mm pin-pitch)
16-Bit, 130 MSPS A/D Converter with LVDS Outputs
General Description
The ADC16V130 is a monolithic high performance CMOS analog-to-digital converter capable of converting analog input signals into 16-bit digital words at rates up to 130 Mega Samples Per Second (MSPS). This converter uses a differential, pipelined architecture with digital error correction and an onchip sample-and-hold circuit to minimize power consumption and external component count while providing excellent dynamic performance. Automatic power-up calibration enables excellent dynamic performance and reduces part-to-part variation, and the ADC16V130 could be re-calibrated at any time by asserting and then de-asserting power-down. An integrated low noise and stable voltage reference and differential reference buffer amplifier easies board level design. On-chip duty cycle stabilizer with low additive jitter allows wide duty cycle range of input clock without compromising its dynamic performance. A unique sample-and-hold stage yields a fullpower bandwidth of 1.4 GHz. The digital data is provided via full data rate LVDS outputs – making possible the 64-pin, 9mm x 9mm LLP package. The ADC16V130 operates on dual power supplies +1.8V and +3.0V with a power-down feature to reduce the power consumption to very low levels while allowing fast recovery to full operation.
Key Specifications
■ Resolution ■ Conversion Rate ■ SNR
(fIN = 10MHz) (fIN = 70MHz) (fIN = 160MHz) SFDR (fIN = 10 MHz) (fIN = 70MHz) (fIN = 160MHz) Full Power Bandwidth Power Consumption Core LVDS Driver Total Operating Temperature Range 16 Bits 130 MSPS 78.5 dBFS (typ) 77.8 dBFS (typ) 76.7 dBFS (typ) 95.5 dBFS (typ) 92.0 dBFS (typ) 90.6 dBFS (typ) 1.4 GHz (typ) 650 mW (typ) 105 mW (typ) 755 mW (typ) -40°C ~ 85°C
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Features
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Dual Supplies: 1.8V and 3.0V operation On chip automatic calibration during power-up Low power consumption Multi-level multi-function pins for CLK/DF and PD Power-down and sleep modes On chip precision reference and sample-and-hold circuit On chip low jitter duty-cycle stabilizer
Applications
■ High IF Sampling Receivers ■ Multi-carrier Base Station Receivers ■ ■ ■ ■
GSM/EDGE, CDMA2000, UMTS, LTE and WiMax Test and Measurement Equipment Communications Instrumentation Data Acquisition Portable Instrumentation
Block Diagram
30062602
© 2009 National Semiconductor Corporation
300626
www.national.com
ADC16V130
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Connection Diagram
30062601
Ordering Information
Industrial (−40°C ≤ TA ≤ +85°C) ADC16V130CISQ ADC16V130EB Package 64 Pin LLP Evaluation Board
www.national.com
2
ADC16V130
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Pin Descriptions
Symbol Equivalent Circuit Function and Connection
Pin No. ANALOG I/O 61
VIN+ Differential analog input pins. The differential full-scale input signal level is 2.4Vpp as default. Each input pin signal centered on a common mode voltage, VCM.
62
VIN-
6,7
VRP
Upper reference voltage. This pin should not be used to source or sink current. The decoupling capacitor to AGND (low ESL 0.1μF) should be placed very close to the pin to minimize stray inductance. VRP needs to be connected to VRN through a low ESL 0.1μF and a low ESR 10μF capacitors in parallel. Lower reference voltage. This pin should not be used to source or sink current. The decoupling capacitor to AGND (low ESL 0.1μF) should be placed very close to the pin to minimize stray inductance. VRN needs to be connected to VRP through a low ESL 0.1μF and a low ESR 10μF capacitors in parallel. Common mode voltage The decoupling capacitor to AGND (low ESL 0.1μF) should be placed as close to the pin as possible to minimize stray inductance. It is recommended to use VRM to provide the common mode voltage for the differential analog inputs. Internal reference voltage output / External reference voltage input. By default, this pin is the output for the internal 1.2V voltage reference. This pin should not be used to sink or source current and should be decoupled to AGND with a 0.1μF, low ESL capacitor. The decoupling capacitors should be placed as close to the pins as possible to minimize inductance and optimize ADC performance. The size of decoupling capacitor should not be larger than 0.1μF, otherwise dynamic performance after power-up calibration can drop due to the long VREF settling. This pin can also be used as the input for a low noise external reference voltage. The output impedance for the internal reference at this pin is 9 kΩ and this can be overdriven provided the impedance of the external source is <<9 kΩ. Careful decoupling is just as essential when an external reference is used. The 0.1µF low ESL decoupling capacitor should be placed as close to this pin as possible. The Input differential vo.