AN217

INTEGRATED CIRCUITS www.DataSheet4U.com AN217 Metastability tests for the 74F786 – a 4-input asynchronous bus arbiter 1988 Jul 18 Philips Semiconductors Philips Semiconductors Application note Metastability tests for the 74F786 – 4-input asynchronous bus arbiter Authors: Charles Dike and Naseer Siddique INTRODUCTION Under contract with Signetics, Mr. Thomas J. Chaney of Washington University, St. Louis tested a set of nineteen 74F786 samples (packages) to determine the metastable state recovery statistics for the circuits. The tests were conducted using a procedure described in a paper entitled “Characterization and Scaling of MOS Flip-Flop Performance”, (section IV), by T. Chaney and F. Rosenberger, presented at the CalTech Conference on VLSI, January 1979. The general test procedure was to test all 19 packages under one condition, then test the best, worst, and an average package in more detail. According to Mr. Chaney, the test results from the 19 packages formed one of the tightest groupings that he has ever seen. As the parts were numbered, package No. 7 had the fastest resolving times, No. 11 produced some of the slowest resolving times, and No. 1 had resolving times near the middle of the test results. This ranking of the test results from 3 packages remained the same throughout the balance of the test program, which supports the complete testing of only 3 packages. In general, the www.DataSheet4U.com poorest performance resulted when the packages were heated to ...