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This
report
presents
the
qual
ification
test
results-on-NE272
series.
2/8
1.Test --
Device
NE272 AI GaAs /In GaAs hetero-junction FEr
2.Qualification
A serres of
tests
Qual ification tests consists of following rierns
l)High 2)High
The The test test
temperature temperature
conditions parameters
DC Bias Reverse
and were
...
