from Texas Instruments
SBOS341B – DECEMBER 2006 – REVISED DECEMBER 2006
Triple 2:1 High-Speed Video Multiplexer
• 700MHz SMALL-SIGNAL BANDWIDTH
(AV = +2)
• 425MHz, 4VPP BANDWIDTH
• 0.1dB GAIN FLATNESS to 150MHz
• 4ns CHANNEL SWITCHING TIME
• LOW SWITCHING GLITCH: 40mVPP
• 3100V/µs SLEW RATE
• 0.025%/0.025° DIFFERENTIAL GAIN, PHASE
• HIGH GAIN ACCURACY: 2.0V/V ±0.4%
• RGB SWITCHING
• LCD PROJECTOR INPUT SELECT
• WORKSTATION GRAPHICS
• TRIPLE ADC INPUT MUX
• DROP-IN UPGRADE TO LT1675
The OPA3875 offers a very wideband, 3-channel, 2:1
multiplexer in a small SSOP-16 package. Using only
11mA/ch, the OPA3875 provides three, gain of +2,
video amplifier channels with > 400MHz large-signal
bandwidth (4VPP). Gain accuracy and switching glitch
are improved over earlier solutions using a new
(patented) input stage switching approach. This
technique uses current steering as the input switch
while maintaining an overall closed-loop design. Gain
matching between each of the 3-channel pairs is
also significantly improved using this technique
(<0.2% gain mismatch). With >700MHz small-signal
bandwidth at a gain of 2, the OPA3875 gives a
typical 0.1dB gain flatness to > 150MHz.
System power may be reduced using the chip enable
feature for the OPA3875. Taking the chip enable line
high powers down the OPA3875 to <900µA total
supply current. Muxing multiple OPA3875 outputs
together, then using the chip enable to select which
channels are active, increases the number of
possible inputs to the 3-channel outputs.
Where a single channel of the OPA3875 is required,
consider the OPA875.
ENABLE RED OUT GREEN OUT
OPA3875 RELATED PRODUCTS
Quad 510MHz 4:1 Multiplexer
Triple 650MHz Video Buffer
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Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
All trademarks are the property of their respective owners.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 2006, Texas Instruments Incorporated