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IDTQS74FCT2374T/AT/CT HIGH-SPEED CMOS BUS INTERFACE 8-BIT REGISTER
INDUSTRIAL TEMPERATURE RANGE
HIGH-SPEED CMOS BUS INTERFACE 8-BIT REGISTER
FEATURES:
• • • • • •
IDTQS74FCT2374T/AT/CT
DESCRIPTION:
CMOS power levels: <7.5mW static Undershoot clamp diodes on all outputs True TTL input and output compatibility Ground bounce controlled outputs Reduced output swing of 0 to 3.5V Built-in 25Ω series resistor outputs reduce reflection and other system noise • Std., A and C speed grades with 5.2ns tPD for C • IOL = 12mA • Available in SOIC package
The IDTQS74FCT2374T is a high-speed CMOS TTL-compatible 8-bit register with a buffered common clock and a buffered output enable control. The IDTQS74FCT2374T has a 25Ω resistor output that is useful for driving transmission lines and reducing system noise. The FCT2374 is a noninverting device. All inputs have clamp diodes for undershoot noise suppression. All outputs have ground bounce suppression. Outputs will not load an active bus when Vcc is removed from the device.
FUNCTIONAL BLOCK DIAGRAM
25Ω
Dx CP OE
11 1
D CP
Q
Ox
INDUSTRIAL TEMPERATURE RANGE
1
c 2004 Integrated Device Technology, Inc.
JANUARY 2004
DSC-5407/5
IDTQS74FCT2374T/AT/CT HIGH-SPEED CMOS BUS INTERFACE 8-BIT REGISTER
INDUSTRIAL TEMPERATURE RANGE
PIN CONFIGURATION
OE O0 D0 D1 O1 O2 D2 D3 O3 GND 1 2 3 4 5 6 7 8 9 10 20 19 18 17 16 15 14 13 12 11 VCC O7 D7 D6 O6 O5 D5 D4 O4 CP
ABSOLUTE MAXIMUM RATINGS(1)
Symbol VTERM TSTG IOUT IIK IOK Description Terminal Voltage with Respect to GND Storage Temperature DC Output Current Max Sink Current/Pin Input Diode Current, VIN < 0 Output Diode Current, VOUT < 0 Max –0.5 to +7 –65 to +150 120 –20 –50 Unit V °C mA mA mA
NOTE: 1. Stresses greater than those listed under ABSOLUTE MAXIMUM RATINGS may cause permanent damage to the device. This is a stress rating only and functional operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect reliability.
CAPACITANCE (TA = +25°C, F = 1.0MHz)
Symbol CIN COUT Parameter(1) Input Capacitance Output Capacitance Conditions VIN = 0V VOUT = 0V Typ. 4 8 Max. — — Unit pF pF
NOTE: 1. This parameter is measured at characterization but not tested.
SOIC TOP VIEW
PIN DESCRIPTION
Pin Names Dx Ox CP OE I/O I O | I Description Data Inputs Data Outputs Clock Input 3-State Output Enable (Active LOW)
FUNCTION TABLE(1)
Inputs OE H H L L H H CP L H ↑ ↑ ↑ ↑ Dx X X L H L H Internal Value Qx — — L H L H Outputs Ox Z Z L H Z Z Function Disable Outputs Disable Outputs Load Input Data Enable Outputs Load Input Data Enable Outputs
NOTE: 1. H = HIGH Voltage Level L = LOW Voltage Level X = Don't Care Z = High-Impedance ↑ = LOW-to-HIGH transition
2
IDTQS74FCT2374T/AT/CT HIGH-SPEED CMOS BUS INTERFACE 8-BIT REGISTER
INDUSTRIAL TEMPERATURE RANGE
DC ELECTRICAL CHARACTERISTICS OVER OPERATING RANGE
Following Conditions Apply Unless Otherwise Specified: Industrial: TA = –40°C to +85°C, VCC = 5.0V ±5%
Symbol VIH VIL ∆VT IIH IIL IOZ IOR VIC VOH VOL ROUT(3) Parameter Input HIGH Level Input LOW Level Input Hysteresis Input HIGH Current Input LOW Current Off-State Output Current (Hi-Z) Current Drive Input Clamp Voltage Output HIGH Voltage Output LOW Voltage Output Resistance VCC = Max 2.0V(2) 0 ≤ VIN ≤ VCC — 50 — 2.4 — 15 — — –0.7 — — 21 ±5 — –1.2 — 0.5 35 µA mA V V V Ω VCC = Max., VOUT = VCC = Min, IIN = -18mA , TA = 25°C(2) VCC = Min. VCC = Min. VCC = Min. IOH = -15mA IOL = 12mA IOH = 12mA Test Conditions Guaranteed Logic HIGH Level Guaranteed Logic LOW Level VTLH - VTHL for all inputs VCC = Max. 0 ≤ VIN ≤ VCC Min. 2 — — — Typ.(1) — — 0.2 — Max. — 0.8 — ±5 Unit V V V µA
NOTES: 1. Typical values are at VCC = 5.0V, TA = 25°C. 2. This parameter is measured at characterization but not tested. 3. ROUT changed on March 8, 2002. See rear page for more information.
POWER SUPPLY CHARACTERISTICS
Following Conditions Apply Unless Otherwise Specified: Industrial: TA = -40°C to +85°C, VCC = 5.0V ± 5% Symbol ICC Parameter Quiescent Power Supply Current Test Conditions(1) VCC = Max. freq = 0 0V ≤ VIN ≤ 0.2V or VCC - 0.2V ≤ VIN ≤ Vcc VCC = Max. VIN = 3.4V(2) freq = 0 VCC = Max. Outputs Open and Enabled One Bit Toggling 50% Duty Cycle Other inputs at GND or Vcc(3,4) Min. — Max. 1.5 Unit mA
∆ICC
Supply Current per Input TTL Inputs HIGH
—
2
mA
ICCD
Supply Current per Input per MHz
—
0.25
mA/MHz
NOTES: 1. For conditions shown as Min. or Max., use the appropriate values specified under DC Electrical Characteristics. 2. Per TLL driven input (VIN = 3.4V). 3. For flip-flops, ICCD is measured by switching one of the data input pins so that the output changes every clock cycle. This is a measurement of device power consumption only and does not include power to drive load capacitance or tester capacitance. 4. IC = IQUIESCENT + IINPUTS + IDYNAMIC IC = ICC + ∆ICC DHNT + ICCD .