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MHL21336N Dataheets PDF



Part Number MHL21336N
Manufacturers Motorola Semiconductor
Logo Motorola Semiconductor
Description RF Linear LDMOS Amplifier
Datasheet MHL21336N DatasheetMHL21336N Datasheet (PDF)

www.DataSheet4U.com Freescale Semiconductor Technical Data Document Number: MHL21336N Rev. 7, 8/2006 3G Band RF Linear LDMOS Amplifier Designed for ultra- linear amplifier applications in 50 ohm systems operating in the 3G frequency band. A silicon FET Class A design provides outstanding linearity and gain. In addition, the excellent group delay and phase linearity characteristics are ideal for digital CDMA modulation systems. • Third Order Intercept: 45 dBm Typ • Power Gain: 31 dB Typ (@ f =.

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www.DataSheet4U.com Freescale Semiconductor Technical Data Document Number: MHL21336N Rev. 7, 8/2006 3G Band RF Linear LDMOS Amplifier Designed for ultra- linear amplifier applications in 50 ohm systems operating in the 3G frequency band. A silicon FET Class A design provides outstanding linearity and gain. In addition, the excellent group delay and phase linearity characteristics are ideal for digital CDMA modulation systems. • Third Order Intercept: 45 dBm Typ • Power Gain: 31 dB Typ (@ f = 2140 MHz) • Input VSWR v 1.5:1 Features • Excellent Phase Linearity and Group Delay Characteristics • Ideal for Feedforward Base Station Applications • N Suffix Indicates Lead - Free Terminations MHL21336N 2110 - 2170 MHz 3.0 W, 31 dB RF LINEAR LDMOS AMPLIFIER CASE 301AP - 02, STYLE 1 Table 1. Absolute Maximum Ratings (TC = 25°C unless otherwise noted) Rating DC Supply Voltage RF Input Power Storage Temperature Range Operating Case Temperature Range Symbol VDD Pin Tstg TC Value 30 +5 - 40 to +100 - 20 to +100 Unit Vdc dBm °C °C Table 2. Electrical Characteristics (VDD = 26 Vdc, TC = 25°C; 50 Ω System) Characteristic Supply Current Power Gain Gain Flatness Power Output @ 1 dB Compression (f = 2140 MHz) (f = 2110 - 2170 MHz) (f = 2140 MHz) Symbol IDD Gp GF P1dB ITO NF Min — 30 — 34 44 — Typ 500 31 0.15 35 45 4.5 Max 525 33 0.4 — — 5 Unit mA dB dB dBm dBm dB Third Order Intercept (f1 = 2137 MHz, f2 = 2142 MHz) Noise Figure (f = 2170 MHz) NOTE - CAUTION - MOS devices are susceptible to damage from electrostatic charge. Reasonable precautions in handling and packaging MOS devices should be observed. © Freescale Semiconductor, Inc., 2006. All rights reserved. MHL21336N 1 RF Device Data Freescale Semiconductor www.DataSheet4U.com TYPICAL CHARACTERISTICS 40 G p , POWER GAIN/RETURN LOSS (dB) 30 20 P1dB, ITO (dBm) 10 0 −10 IRL −20 −30 −40 1400 1600 1800 2000 2200 2400 2600 2800 30 25 1800 ORL 45 40 35 P1dB Gp VDD = 26 Vdc TC = 25_C 55 50 ITO VDD = 26 Vdc TC = 25_C 1900 2000 2100 2200 2300 2400 2500 f, FREQUENCY (MHz) f, FREQUENCY (MHz) Figure 1. Power Gain, Input Return Loss, Output Return Loss versus Frequency Figure 2. P1dB, ITO versus Frequency 40 VDD = 26 Vdc f = 2140 MHz G p , POWER GAIN (dB) 35 Gp 600 48 47 VDD = 26 Vdc f = 2140 MHz 38 37 36 ITO 35 P1dB 34 33 32 120 550 P1dB (dBm) PHASE LINEARITY (_ ) 46 500 IDD 450 43 ITO (dBm) I DD (mA) 45 44 30 25 20 −40 −20 0 20 40 60 80 100 400 120 42 −40 −20 0 20 40 60 80 100 TEMPERATURE (_C) TEMPERATURE (_C) Figure 3. Power Gain, IDD versus Temperature Figure 4. ITO, P1dB versus Temperature −1400 −1420 VDD = 26 Vdc f = 2140 MHz 2.4 2.3 GROUP DELAY (nS) 0.6 0.5 0.4 0.3 0.2 PHASE LINEARITY 0.1 0 −40 GF VDD = 26 Vdc f = 2110 − 2170 MHz 0.6 0.5 0.4 0.3 0.2 0.1 0 120 PHASE ( _ ) −1440 −1460 GROUP DELAY PHASE 2.2 2.1 −1480 2 −1500 −40 −20 0 20 40 60 80 100 1.9 120 G F , GAIN FLATNESS (dB) −20 0 20 40 60 80 100 TEMPERATURE (_C) TEMPERATURE (_C) Figure 5. Phase(1), Group Delay(1) versus Temperature 1. In Production Test Fixture Figure 6. Gain Flatness, Phase Linearity versus Temperature MHL21336N 2 RF Device Data Freescale Semiconductor www.DataSheet4U.com TYPICAL CHARACTERISTICS 31.8 31.6 G p , POWER GAIN (dB) IDD f = 2140 MHz TC = 25_C 700 600 47.5 47 46.5 46 P1dB ITO f = 2140 MHz TC = 25_C 37 36.5 P1dB (dBm) PHASE LINEARITY (_ ) 36 35.5 35 34.5 34 23 24 25 26 27 28 29 30 VOLTAGE (VOLTS) 31.4 31.2 Gp 500 400 31 30.8 22 300 200 23 24 25 26 27 28 29 30 VOLTAGE (VOLTS) I DD (mA) ITO (dBm) 45.5 45 44.5 22 Figure 7. Power Gain, IDD versus Voltage Figure 8. ITO, P1dB versus Voltage −1435 f = 2140 MHz TC = 25_C −1436 PHASE ( _ ) GROUP DELAY 2.3 0.35 0.3 f = 2110 − 2170 MHz TC = 25_C 0.35 0.3 0.25 GF 0.2 2.25 −1437 PHASE −1438 2.2 GROUP DELAY (nS) G F , GAIN FLATNESS (dB) 0.25 0.2 0.15 0.1 PHASE LINEARITY 0.15 0.1 2.15 0.05 −1439 22 2.1 23 24 25 26 27 28 29 30 VOLTAGE (VOLTS) 0 22 0.05 0 23 24 25 26 27 28 29 30 VOLTAGE (VOLTS) Figure 9. Phase(1), 1. In Production Test Fixture Group Voltage Delay(1) versus Figure 10. Phase Linearity, Gain Flatness versus Voltage MHL21336N RF Device Data Freescale Semiconductor 3 www.DataSheet4U.com PACKAGE DIMENSIONS A G 0.020 (0.51) M A S 2X Q 0.008 (0.20) M T S M A M T A M B R J K W 4X 1 2 3 4 S NOTES: 1. INTERPRET DIMENSIONS AND TOLERANCES PER ASME Y14.5M, 1994. 2. CONTROLLING DIMENSION: INCH. 3. DIMENSION "F" TO CENTER OF LEADS. DIM A B C D E F G H J K L N P Q R S W INCHES MIN MAX 1.760 1.780 1.370 1.390 0.245 0.265 0.017 0.023 0.080 0.100 0.086 BSC 1.650 BSC 1.290 BSC 0.266 0.280 0.125 0.165 0.990 BSC 0.390 BSC 0.008 0.013 0.118 0.132 0.535 0.555 0.445 0.465 0.090 BSC MILLIMETERS MIN MAX 44.70 45.21 34.80 35.31 6.22 6.73 0.43 0.58 2.03 2.54 2.18 BSC 41.91 BSC 32.77 BSC 6.76 7.11 3.18 4.19 25.15 BSC 9.91 BSC 0.20 0.33 3.00 3.35 13.59 14.10 11.30 11.81 2.29 BSC D M N L H F E C T SEATING PLANE M 0.020 (0.51) M T B 4X P.


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