February 1997
NDS352AP P-Channel Logic Level Enhancement Mode Field Effect Transistor
General Description
These P -Chan...
February 1997
NDS352AP P-Channel Logic Level Enhancement Mode Field Effect
Transistor
General Description
These P -Channel logic level enhancement mode power field effect
transistors are produced using Fairchild's proprietary, high cell density, DMOS technology. This very high density process is especially tailored to minimize on-state resistance. These devices are particularly suited for low voltage applications such as notebook computer power management, portable electronics, and other battery powered circuits where fast high-side switching, and low in-line power loss are needed in a very small outline surface mount package.
Features
-0.9 A, -30 V. RDS(ON) = 0.5 Ω @ VGS = -4.5 V RDS(ON) = 0.3 Ω @ VGS = -10 V. Industry standard outline SOT-23 surface mount package using proprietary SuperSOTTM-3 design for superior thermal and electrical capabilities. High density cell design for extremely low RDS(ON). Exceptional on-resistance and maximum DC current capability.
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G
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Absolute Maximum Ratings
Symbol VDSS VGSS ID Parameter Drain-Source Voltage
T A = 25°C unless otherwise noted
NDS352AP -30 ±20
(Note 1a)
Units V V A
Gate-Source Voltage - Continuous Maximum Drain Current - Continuous - Pulsed
±0.9 ±10
PD TJ,TSTG
Maximum Power Dissipation
(Note 1a) (Note 1b)
0.5 0.46 -55 to 150
W
Operating and Storage Temperature Range
°C
THERMAL CHARACTERISTICS RθJA RθJC Thermal Resistance, Junct...