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FQA28N50

Fairchild Semiconductor

500V N-Channel MOSFET

FQA28N50 — N-Channel QFET® MOSFET FQA28N50 N-Channel QFET® MOSFET 500 V, 28.4 A, 160 mΩ Features • 28.4 A, 500 V, RDS(o...


Fairchild Semiconductor

FQA28N50

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Description
FQA28N50 — N-Channel QFET® MOSFET FQA28N50 N-Channel QFET® MOSFET 500 V, 28.4 A, 160 mΩ Features 28.4 A, 500 V, RDS(on) = 160 mΩ (Max.) @ VGS = 10 V, ID = 14.2 A Low Gate Charge (Typ. 110 nC) Low Crss (Typ. 60 pF) 100% Avalanche Tested RoHS compliant August 2014 Description These N-Channel enhancement mode power field effect transistors are produced using Fairchild’s proprietary, planar stripe, DMOS technology. This advanced technology has been especially tailored to minimize on-state resistance, provide superior switching performance, and withstand high energy pulse in the avalanche and commutation mode. These devices are well suited for high efficiency switch mode power supply, power factor correction, electronic lamp ballast based on half bridge. D G DS TO-3PN Absolute Maximum Ratings TC = 25°C unless otherwise noted. Symbol VDSS ID IDM VGSS EAS IAR EAR dv/dt PD TJ, TSTG TL Parameter Drain-Source Voltage Drain Current - Continuous (TC = 25°C) - Continuous (TC = 100°C) Drain Current - Pulsed Gate-Source Voltage Single Pulsed Avalanche Energy Avalanche Current Repetitive Avalanche Energy Peak Diode Recovery dv/dt Power Dissipation (TC = 25°C) - Derate above 25°C Operating and Storage Temperature Range Maximum Lead Temperature for Soldering, 1/8" from Case for 5 Seconds (Note 1) (Note 2) (Note 1) (Note 1) (Note 3) Thermal Characteristics Symbol RθJC RθCS RθJA Parameter Thermal Resistance, Junction-to-Case Thermal Resistance, Case-to-Sink The...




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