UPD78F0134

User’s Manual 78K0/KE1 8-Bit Single-Chip Microcontrollers µPD780131 µPD780132 µPD780133 µPD780134 µPD780136 µPD780138 µPD78F0134 µPD78F0138 µPD780131(A) µPD780132(A) µPD780133(A) µPD780134(A) µPD780136(A) µPD780138(A) µPD78F0134(A) µPD78F0138(A) µPD780131(A1) µPD780132(A1) µPD780133(A1) µPD780134(A1) µPD780136(A1) µPD780138(A1) µPD78F0134(A1) µPD78F0138(A1) µPD780131(A2) µPD780132(A2) µPD780133(A2) µPD780134(A2) µPD780136(A2) µPD780138(A2) Document No. U16228EJ2V0UD00 (2nd edition) Date Published November 2003 N CP(K) 2002 Printed in Japan [MEMO] 2 User’s Manual U16228EJ2V0UD NOTES FOR CMOS DEVICES 1 PRECAUTION AGAINST ESD FOR SEMICONDUCTORS Note: Strong electric field, when exposed to a MOS device, can cause destruction of the gate oxide and ultimately degrade the device operation. Steps must be taken to stop generation of static electricity as much as possible, and quickly dissipate it once, when it has occurred. Environmental control must be adequate. When it is dry, humidifier should be used. It is recommended to avoid using insulators that easily build static electricity. Semiconductor devices must be stored and transported in an anti-static container, static shielding bag or conductive material. All test and measurement tools including work bench and floor should be grounded. The operator should be grounded using wrist strap. Semiconductor devices must not be touched with bare hands. Similar precautions need to be taken for PW boards with semiconductor devices...