SN54BCT8245A

SN54BCT8245A, SN74BCT8245A SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS SCBS043E − MAY 1990 − REVISED JULY 1996 D Members of the Texas Instruments SCOPE ™ Family of Testability Products D Octal Test-Integrated Circuits D Functionally Equivalent to ’F245 and ’BCT245 in the Normal- Function Mode D Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture D Test Operation Synchronous to Test Access Port (TAP) D Implement Optional Test Reset Signal by Recognizing a Double-High-Level Voltage (10 V ) on TMS Pin D SCOPE ™ Instruction Set − IEEE Standard 1149.1-1990 Required Instructions, Optional INTEST, CLAMP, and HIGHZ − Parallel-Signature Analysis at Inputs − Pseudo-Random Pattern Generation From Outputs − Sample Inputs/Toggle Outputs D Package Options Include Plastic Small-Outline (DW) Packages, Ceramic Chip Carriers (FK), and Standard Plastic and Ceramic 300-mil DIPs (JT, NT) description The ’BCT8245A scan test devices with octal bus transceivers are members of the Texas Instruments SCOPE™ testability integratedcircuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies. Scan access to the test circuitry is accomplished via the 4-wire test access port (TAP) interface. SN54BCT8245A . . . JT PACKAGE SN74BCT8245A . . . DW OR NT PACKAGE (TOP VIEW) DIR 1 B1 2 B2 3 B3 4 B4 5 GND 6 B5 7 B6 8 B7 9 B8 10 TDO 11 TMS 12 24 OE 23 A1 22 A2 21 A3 20 A4 19 A5 1...