SN54BCT8244A

SN54BCT8244A, SN74BCT8244A SCAN TEST DEVICES WITH OCTAL BUFFERS SCBS042E − FEBRUARY 1990 − REVISED JULY 1996 D Members of the Texas Instruments SCOPE™ Family of Testability Products D Octal Test-Integrated Circuits D Functionally Equivalent to ’F244 and ’BCT244 in the Normal-Function Mode D Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture D Test Operation Synchronous to Test Access Port (TAP) D Implement Optional Test Reset Signal by Recognizing a Double-High-Level Voltage (10 V ) on TMS Pin D SCOPE™ Instruction Set − IEEE Standard 1149.1-1990 Required Instructions, Optional INTEST, CLAMP and HIGHZ − Parallel-Signature Analysis at Inputs − Pseudo-Random Pattern Generation From Outputs − Sample Inputs/Toggle Outputs D Package Options Include Plastic Small-Outline (DW) Packages, Ceramic Chip Carriers (FK), and Standard Plastic and Ceramic 300-mil DIPs (JT, NT) description The ’BCT8244A scan test devices with octal buffers are members of the Texas Instruments SCOPE™ testability integrated-circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies. Scan access to the test circuitry is accomplished via the 4-wire test access port (TAP) interface. SN54BCT8244A . . . JT PACKAGE SN74BCT8244A . . . DW OR NT PACKAGE (TOP VIEW) 1OE 1 1Y1 2 1Y2 3 1Y3 4 1Y4 5 GND 6 2Y1 7 2Y2 8 2Y3 9 2Y4 10 TDO 11 TMS 12 24 2OE 23 1A1 22 1A2 21 1A3 20 1A4 19 2A1 18 ...