MOTOROLA
SEMICONDUCTOR TECHNICAL DATA
Order this document by MMAS40G10D/D
Micromachined Accelerometer
± 40g
The MMAS40G family of silicon capacitive, micro–machined accelerometers features integral signal amplification, signal conditioning, a 4–pole low–pass filter and temperature compensation. Zero–G offset, full scale span and filter roll–off are factory set and require no external passives. A calibrated self–test feature mechanically displaces the seismic mass with the application of a dig.
MICROMACHINED ACCELEROMETER 40g
MOTOROLA
SEMICONDUCTOR TECHNICAL DATA
Order this document by MMAS40G10D/D
Micromachined Accelerometer
± 40g
The MMAS40G family of silicon capacitive, micro–machined accelerometers features integral signal amplification, signal conditioning, a 4–pole low–pass filter and temperature compensation. Zero–G offset, full scale span and filter roll–off are factory set and require no external passives. A calibrated self–test feature mechanically displaces the seismic mass with the application of a digital self–test signal. The MMAS40G incorporates a single polysilicon seismic mass, suspended between two fixed polysilicon plates (G–cell). The forces of acceleration move the seismic mass, thereby resulting in a change in capacitance. The G–cell is sealed at the wafer level, creating a particle–free environment. The G–cell features built–in damping and over–range stops to protect it from mechanical shock. MMAS40G accelerometers are ideally suited for automotive crash detection and recording, vibration monitoring, automotive suspension control, appliance control systems, etc. Features • Minimum Full Scale Measurement ± 40g • Calibrated, True Self–Test • Standard 16–Pin Plastic DIP package • Senses Perpendicular to the Printed Circuit Board • Integral Signal Conditioning and 4–Pole Filter • Linear Output • Robust, High Shock Survivability
1 2 3 4 5 6
MMAS40G10D
MICROMACHINED ACCELEROMETER ± 40g
10 9 12 11 14 13 16 15
7 8 5 6 3 4 1 2
DIP PACKAGE CASE 648C–03
PIN NUMBER (DIP)
N/C (1).