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K9F6408U0M-TCB0

Samsung semiconductor

8M x 8 Bit NAND Flash Memory

K9F6408U0M-TCB0, K9F6408U0M-TIB0 Document Title 8M x 8 Bit NAND Flash Memory FLASH MEMORY Revision History Revision No...


Samsung semiconductor

K9F6408U0M-TCB0

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K9F6408U0M-TCB0, K9F6408U0M-TIB0 Document Title 8M x 8 Bit NAND Flash Memory FLASH MEMORY Revision History Revision No. History 0.0 1.0 1.1 Initial issue. Data Sheet, 1998 Data Sheet. 1999 1) Added CE don’ t care mode during the data-loading and reading 1.2 1.3 1) Revised real-time map-out algorithm(refer to technical notes) Changed device name - KM29U64000T -> K9F6408U0M-TCB0 - KM29U64000IT -> K9F6408U0M-TIB0 July 23th 1999 Sep. 15th 1999 Final Final Draft Date April 10th 1998 July 14th 1998 April 10th 1999 Remark Preliminary Final Final The attached datasheets are prepared and approved by SAMSUNG Electronics. SAMSUNG Electronics CO., LTD. reserve the right to change the specifications. SAMSUNG Electronics will evaluate and reply to your requests and questions about device. If you have any questions, please contact the SAMSUNG branch office near you. 1 K9F6408U0M-TCB0, K9F6408U0M-TIB0 8M x 8 Bit NAND Flash Memory FEATURES Voltage Supply : 2.7V ~ 3.6V Organization - Memory Cell Array : (8M + 256K)bit x 8bit - Data Register : (512 + 16)bit x8bit Automatic Program and Erase - Page Program : (512 + 16)Byte - Block Erase : (8K + 256)Byte 528-Byte Page Read Operation - Random Access : 7µs(Max.) - Serial Page Access : 50ns(Min.) Fast Write Cycle Time - Program time : 200 µs(typ.) - Block Erase time : 2ms(typ.) Command/Address/Data Multiplexed I/O port Hardware Data Protection - Program/Erase Lockout During Power Transitions Reliable CMOS Floating-Gate Technol...




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