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HiPerFETTM Power MOSFETs ISOPLUS247TM
(Electrically Isolated Backside) Single MOSFET Die Avalanche ...
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HiPerFETTM Power
MOSFETs ISOPLUS247TM
(Electrically Isolated Backside) Single
MOSFET Die Avalanche Rated
Preliminary Data Sheet
Symbol VDSS VDGR VGS VGSM ID25 IDM IAR EAR EAS dv/dt PD TJ TJM Tstg TL VISOL Weight 1.6 mm (0.063 in.) from case for 10 s 50/60 Hz, RMS t = 1 min Test Conditions TJ = 25°C to 150°C TJ = 25°C to 150°C; RGS = 1 MΩ Continuous Transient TC = 25°C (
MOSFET chip capability) TC = 25°C, Note 1 TC = 25°C TC = 25°C TC = 25°C IS ≤ IDM, di/dt ≤ 100 A/µs, VDD ≤ VDSS TJ ≤ 150°C, RG = 2 Ω TC = 25°C
IXFR 34N80 VDSS = 800
ID25 = 28 RDS(on) = 0.24 trr ≤ 250 ns
V A Ω
Maximum Ratings 800 800 ± 20 ± 30 28 600 150 60 3 5 400 -55 ... +150 150 -55 ... +150 300 2500 5 V V V V A A A mJ J V/ns
ISOPLUS 247TM E153432
G D S Isolated backside*
G = Gate S = Source
D = Drain
* Patent pending
Features W °C °C °C °C V~ g
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Silicon chip on Direct-Copper-Bond substrate - High power dissipation - Isolated mounting surface - 2500V electrical isolation Low drain to tab capacitance(<25pF) Low RDS (on) HDMOSTM process Rugged polysilicon gate cell structure Unclamped Inductive Switching (UIS) rated Fast intrinsic Rectifier
Applications
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Symbol
Test Conditions
Characteristic Values (TJ = 25°C, unless otherwise specified) min. typ. max. 150 2.0 V 4.0 V ±100 nA TJ = 25°C TJ = 125°C 100 µA 2 mA 0.24 Ω
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VDSS VGS(th) IGSS IDSS RDS(on)
VGS = 0 V, ID = 3mA VDS = VGS, ID = 8mA VGS = ±20 V, VDS = 0 VDS = VDSS VGS = 0 V VGS = 10 V, ID = IT Notes 2, 3
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