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HY27UG164G2M

Hynix Semiconductor

(HY27UGxx Series) 2G-Bit NAND Flash

w e e Document h Title S / 256Mx16bit) NAND Flash Memory 4Gbit (512Mx8bit a at .D History Revision w w Revision No. 0.0...


Hynix Semiconductor

HY27UG164G2M

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w e e Document h Title S / 256Mx16bit) NAND Flash Memory 4Gbit (512Mx8bit a at .D History Revision w w Revision No. 0.0 U 4 t . m o c Preliminary HY27UG(08/16)4G(2/D)M Series 4Gbit (512Mx8bit / 256Mx16bit) NAND Flash History Draft Date May. 13. 2005 Remark Preliminary Initial Draft. 1) Add Errata tWH tWP 25 35 tWC 50 60 0.1 Specification Relaxed value 15 20 May. 23. 2005 1) Correct the Valid Blocks Number. 0.2 Valid Blocks (max) Before After 4,098 4,096 1) Add tRSBY (Table 11) - tRSBY (Dummy Busy Time for Cache Read) 0.3 - tRSBY is 5us (typ.) 2) Edit Figure 18, 19 1) Add ULGA Package. 3) Correct Extended Read Status Register Commands (Table. 19) - Figures & texts are added. 2) Correct the test Conditions (DC Characteristics table) Test Conditions (ILI, ILO) Before VIN=VOUT=0 to 3.6V VIN=VOUT=0 to Vcc (max) 0.4 After w Rev 0.5 / Oct. 2005 3) Change AC Conditions table 4) Add tWW parameter ( tWW = 100ns, min) - Texts & Figures are added. - tWW is added in AC timing characteristics table. 5) Edit System Interface Using CE don’t care Figures. w w .D t a S a e h t e U 4 .c m o Preliminary Jun. 13. 2005 Preliminary JUn. 14. 2005 Preliminary Sep. 02. 2005 Preliminary 6) Correct Address Cycle Map. w w w .D at h S a t e e 4U . m o c 1 Preliminary HY27UG(08/16)4G(2/D)M Series 4Gbit (512Mx8bit / 256Mx16bit) NAND Flash Revision History Revision No. History 7) Correct PKG dimension (TSOP PKG) CP Before After 0.050 0.100 -Continued- Draf...




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